Coupling of strain, stress, and oxygen non-stoichiometry in thin film Pr0.1Ce0.9O2-δ

J. Sheth, D. Chen, J. J. Kim, W. J. Bowman, Peter Crozier, H. L. Tuller, S. T. Misture, S. Zdzieszynski, B. W. Sheldon, S. R. Bishop

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Engineering & Materials Science