Corrigendum to "Enhanced lithiation and fracture behavior of silicon mesoscale pillars via atomic layer coatings and geometry design" J.Power Sources 248 (2014) 447-456]

J. C. Ye, Y. H. An, T. W. Heo, M. M. Biener, R. J. Nikolic, M. Tang, Hanqing Jiang, Y. M. Wang

Research output: Contribution to journalArticle

Original languageEnglish (US)
JournalJournal of Power Sources
DOIs
StateAccepted/In press - 2015

Fingerprint

Silicon
Coatings
Geometry
corrigendum

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Energy Engineering and Power Technology
  • Renewable Energy, Sustainability and the Environment
  • Physical and Theoretical Chemistry

Cite this

Corrigendum to "Enhanced lithiation and fracture behavior of silicon mesoscale pillars via atomic layer coatings and geometry design" J.Power Sources 248 (2014) 447-456]. / Ye, J. C.; An, Y. H.; Heo, T. W.; Biener, M. M.; Nikolic, R. J.; Tang, M.; Jiang, Hanqing; Wang, Y. M.

In: Journal of Power Sources, 2015.

Research output: Contribution to journalArticle

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author = "Ye, {J. C.} and An, {Y. H.} and Heo, {T. W.} and Biener, {M. M.} and Nikolic, {R. J.} and M. Tang and Hanqing Jiang and Wang, {Y. M.}",
year = "2015",
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journal = "Journal of Power Sources",
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AU - Biener, M. M.

AU - Nikolic, R. J.

AU - Tang, M.

AU - Jiang, Hanqing

AU - Wang, Y. M.

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