Correlative characterization of dislocation defects and defect clusters in GaAs and CdTe solar cells by spatially resolved optical techniques and high-resolution TEM

Q. Chen, B. S. McKeon, J. Becker, S. Zhang, C. K. Hu, T. H. Gfroerer, T. H. Gfroerer, Yong-Hang Zhang, David Smith, Y. Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An array of correlative and spatially-resolved techniques, including electroluminescence, photoluminescence, Raman, I-V curve, and high-resolution TEM, have been performed on both GaAs and CdTe solar cells, to study the impact of individual dislocation defects and defect clusters on device performance, the dependence of the impact on the device operation conditions, and the microscopic structures of the defects. This approach offers quantitative and definitive correlation between the atomistic structure of a defect and its effects in a real device.

Original languageEnglish (US)
Title of host publication2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3234-3236
Number of pages3
ISBN (Electronic)9781538685297
DOIs
StatePublished - Nov 26 2018
Event7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States
Duration: Jun 10 2018Jun 15 2018

Publication series

Name2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

Other

Other7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
CountryUnited States
CityWaikoloa Village
Period6/10/186/15/18

Fingerprint

Solar cells
Transmission electron microscopy
Defects
Electroluminescence
Photoluminescence
gallium arsenide

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Chen, Q., McKeon, B. S., Becker, J., Zhang, S., Hu, C. K., Gfroerer, T. H., ... Zhang, Y. (2018). Correlative characterization of dislocation defects and defect clusters in GaAs and CdTe solar cells by spatially resolved optical techniques and high-resolution TEM. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC (pp. 3234-3236). [8548288] (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2018.8548288

Correlative characterization of dislocation defects and defect clusters in GaAs and CdTe solar cells by spatially resolved optical techniques and high-resolution TEM. / Chen, Q.; McKeon, B. S.; Becker, J.; Zhang, S.; Hu, C. K.; Gfroerer, T. H.; Gfroerer, T. H.; Zhang, Yong-Hang; Smith, David; Zhang, Y.

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc., 2018. p. 3234-3236 8548288 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chen, Q, McKeon, BS, Becker, J, Zhang, S, Hu, CK, Gfroerer, TH, Gfroerer, TH, Zhang, Y-H, Smith, D & Zhang, Y 2018, Correlative characterization of dislocation defects and defect clusters in GaAs and CdTe solar cells by spatially resolved optical techniques and high-resolution TEM. in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC., 8548288, 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers Inc., pp. 3234-3236, 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018, Waikoloa Village, United States, 6/10/18. https://doi.org/10.1109/PVSC.2018.8548288
Chen Q, McKeon BS, Becker J, Zhang S, Hu CK, Gfroerer TH et al. Correlative characterization of dislocation defects and defect clusters in GaAs and CdTe solar cells by spatially resolved optical techniques and high-resolution TEM. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc. 2018. p. 3234-3236. 8548288. (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC). https://doi.org/10.1109/PVSC.2018.8548288
Chen, Q. ; McKeon, B. S. ; Becker, J. ; Zhang, S. ; Hu, C. K. ; Gfroerer, T. H. ; Gfroerer, T. H. ; Zhang, Yong-Hang ; Smith, David ; Zhang, Y. / Correlative characterization of dislocation defects and defect clusters in GaAs and CdTe solar cells by spatially resolved optical techniques and high-resolution TEM. 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 3234-3236 (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC).
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