Correlation field analysis of the influence of device geometry and bulk disorder on electron interference in quantum wires

Yuichi Ochiai, Kazunuki Yamamoto, Taizoh Onishi, Mitsuo Kawabe, Koji Ishibashi, Jonathan P. Bird, Yoshinobu Aoyagi, Takuo Sugano, David K. Ferry

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Scopus citations

Abstract

We analyze the magnetic field dependence of the correlation field Bc of universal conductance fluctuations (UCF), observed in GaAs/AlGaAs quantum wires. At sufficiently high magnetic fields, the Landau level quantization is resolved, and Bc is found to increase as a power law of magnetic field with an exponent which depends sensitively upon temperature. We show that this behavior results from a change in the nature of the (zero field) phase-coherent region for electron interference in the quantum wire; at high temperatures the phase-breaking length is less than the width, and the region is determined by the bulk impurities, while at lower temperatures, it is strongly influenced by the boundaries of the wire. We compare our results with recent theoretical predictions for the UCF at high magnetic fields, and show that the correlation analysis field provides a valuable tool for analyzing electron interference in quantum wires.

Original languageEnglish (US)
Title of host publicationJapanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers
EditorsSeigo Tarucha, Yasuhiko Arakawa, Masao Fukuma, Kazuhito Furuya, Yoshiji Horikoshi, al et al
Place of PublicationMinato-ku, Japan
PublisherJJAP
Pages1339-1341
Number of pages3
Volume34
Edition2 B
StatePublished - Feb 1995
EventProceedings of the 1994 International Conference on Solid State Devices and Materials (SSDM'94) - Yokohama, Jpn
Duration: Aug 23 1994Aug 26 1994

Other

OtherProceedings of the 1994 International Conference on Solid State Devices and Materials (SSDM'94)
CityYokohama, Jpn
Period8/23/948/26/94

ASJC Scopus subject areas

  • Engineering(all)

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    Ochiai, Y., Yamamoto, K., Onishi, T., Kawabe, M., Ishibashi, K., Bird, J. P., Aoyagi, Y., Sugano, T., & Ferry, D. K. (1995). Correlation field analysis of the influence of device geometry and bulk disorder on electron interference in quantum wires. In S. Tarucha, Y. Arakawa, M. Fukuma, K. Furuya, Y. Horikoshi, & A. et al (Eds.), Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers (2 B ed., Vol. 34, pp. 1339-1341). JJAP.