CORRELATED ELECTRICAL AND MICROSTRUCTURAL STUDIES OF RECRYSTALLIZED SILICON THIN FILMS ON BULK GLASS SUBSTRATES.

D. K. Biegelsen, N. M. Johnson, R. J. Nemanich, M. D. Moyer, L. E. Fennell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

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