Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces

Uwe Weierstall, J. M. Zuo, T. Kjorsvik, John Spence

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

This paper describes the design and construction of a dedicated UHV diffraction camera with an energy filter for convergent beam reflection electron diffraction (CB-RHEED). The advantages of this system for studying surface structures are demonstrated through applications to silicon (111) and (001) reconstructed surfaces. CB-RHEED patterns of the Si(001)-2×1 reconstruction clearly show a mirror symmetry at room temperature, which is not present in dynamical calculations with the buckled dimer model.

Original languageEnglish (US)
Pages (from-to)239-250
Number of pages12
JournalSurface Science
Volume442
Issue number2
DOIs
StatePublished - Nov 20 1999

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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