Convergent beam electron microdiffraction from small crystals

J. M. Cowley, John Spence

Research output: Contribution to journalArticle

40 Citations (Scopus)

Abstract

Diffraction spots in convergent beam electron diffraction patterns obtained with a coherent incident beam show a characteristic fine structure when the incident beam is close to a small crystal or the edge of a larger crystal. The fine structure may take the form of a splitting of the spot into two or more sharp spots or else a bright annulus with a dark spot in the middle. It is shown that this fine structure results from coherent interference effects for an asymmetrically placed crystal and reflects the sensitivity of the relative phases of the diffraction pattern amplitudes to the absolute position of the diffracting object.

Original languageEnglish (US)
Pages (from-to)359-366
Number of pages8
JournalUltramicroscopy
Volume6
Issue number1
DOIs
StatePublished - 1981

Fingerprint

Electron beams
fine structure
electron beams
Diffraction patterns
Crystals
diffraction patterns
crystals
annuli
Electron diffraction
electron diffraction
Diffraction
interference
diffraction

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Convergent beam electron microdiffraction from small crystals. / Cowley, J. M.; Spence, John.

In: Ultramicroscopy, Vol. 6, No. 1, 1981, p. 359-366.

Research output: Contribution to journalArticle

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