@inproceedings{b27cff5052c349428c3401f2a65289be,
title = "Controlling Silicon Bottom Cell Lifetime Variance in II-VI/Si Tandems",
abstract = "An intricate look is taken at the methods used to account for variance in minority-carrier lifetime in the silicon bottom cell of II-VI/Si tandem solar cells. A discussion on the modeling is provided. Lateral wafer variance is determined to be much less than wafer-to-wafer variance. Size testing indicates a minimum size of 4 × 4 cm is necessary for accurate results. The cleaning procedure and photoluminescence testing is described. Despite a small sample size, Si samples with CdTe deposition and CdCl2 treatment maintain over 1 ms lifetimes, enabling the Si bottom cell in II-VI/Si tandem cells to reach state-of-the-art performance.",
keywords = "II-VI, IZO, cadmium telluride, minority-carrier lifetime, multijunction, tandem",
author = "Tyler, {Kevin D.} and Arulanandam, {Madhan K.} and Ramesh Pandey and Kumar, {Niranjana Mohan} and Jennifer Drayton and James Sites and King, {Richard R.}",
note = "Funding Information: This work was funded by the National Science Foundation (NSF), Division of Electrical, Communications and Cyber Systems (ECCS), program #1665299. Publisher Copyright: {\textcopyright} 2019 IEEE.; 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 ; Conference date: 16-06-2019 Through 21-06-2019",
year = "2019",
month = jun,
doi = "10.1109/PVSC40753.2019.8980707",
language = "English (US)",
series = "Conference Record of the IEEE Photovoltaic Specialists Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "2188--2191",
booktitle = "2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019",
}