Constructing interaction test suites with greedy algorithms

Renée C. Bryce; Charles Colbourn

doi:10.1145/1101908.1101994

Constructing interaction test suites with greedy algorithms

Renée C. Bryce, Charles Colbourn

Computer Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

10 Scopus citations

Abstract

Combinatorial approaches to testing are used in several fields, and have recently gained momentum in the field of software testing through software interaction testing. One-test-at-a-time greedy algorithms are used to automatically construct such test suites. This paper discusses basic criteria of why greedy algorithms have been appropriate for this test generation problem in the past and then expands upon how greedy algorithms can be utilized to address test suite prioritization.

Original language	English (US)
Title of host publication	20th IEEE/ACM International Conference on Automated Software Engineering, ASE 2005
Pages	440-443
Number of pages	4
DOIs	https://doi.org/10.1145/1101908.1101994
State	Published - 2005
Event	20th IEEE/ACM International Conference on Automated Software Engineering, ASE 2005 - Long Beach, CA, United States Duration: Nov 7 2005 → Nov 11 2005

Other

Other	20th IEEE/ACM International Conference on Automated Software Engineering, ASE 2005
Country/Territory	United States
City	Long Beach, CA
Period	11/7/05 → 11/11/05

Keywords

Biased covering arrays
Covering arrays
Greedy algorithm
Mixed-level covering arrays
Software interaction testing
T-way interaction coverage

ASJC Scopus subject areas

Computational Theory and Mathematics
Human-Computer Interaction
Software

Access to Document

10.1145/1101908.1101994

Cite this

@inproceedings{aa688d0a52f9427c975cc0de0d48fef2,

title = "Constructing interaction test suites with greedy algorithms",

abstract = "Combinatorial approaches to testing are used in several fields, and have recently gained momentum in the field of software testing through software interaction testing. One-test-at-a-time greedy algorithms are used to automatically construct such test suites. This paper discusses basic criteria of why greedy algorithms have been appropriate for this test generation problem in the past and then expands upon how greedy algorithms can be utilized to address test suite prioritization.",

keywords = "Biased covering arrays, Covering arrays, Greedy algorithm, Mixed-level covering arrays, Software interaction testing, T-way interaction coverage",

author = "Bryce, {Ren{\'e}e C.} and Charles Colbourn",

year = "2005",

doi = "10.1145/1101908.1101994",

language = "English (US)",

pages = "440--443",

booktitle = "20th IEEE/ACM International Conference on Automated Software Engineering, ASE 2005",

note = "20th IEEE/ACM International Conference on Automated Software Engineering, ASE 2005 ; Conference date: 07-11-2005 Through 11-11-2005",

}

TY - GEN

T1 - Constructing interaction test suites with greedy algorithms

AU - Bryce, Renée C.

AU - Colbourn, Charles

PY - 2005

Y1 - 2005

N2 - Combinatorial approaches to testing are used in several fields, and have recently gained momentum in the field of software testing through software interaction testing. One-test-at-a-time greedy algorithms are used to automatically construct such test suites. This paper discusses basic criteria of why greedy algorithms have been appropriate for this test generation problem in the past and then expands upon how greedy algorithms can be utilized to address test suite prioritization.

AB - Combinatorial approaches to testing are used in several fields, and have recently gained momentum in the field of software testing through software interaction testing. One-test-at-a-time greedy algorithms are used to automatically construct such test suites. This paper discusses basic criteria of why greedy algorithms have been appropriate for this test generation problem in the past and then expands upon how greedy algorithms can be utilized to address test suite prioritization.

KW - Biased covering arrays

KW - Covering arrays

KW - Greedy algorithm

KW - Mixed-level covering arrays

KW - Software interaction testing

KW - T-way interaction coverage

UR - http://www.scopus.com/inward/record.url?scp=77952406129&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77952406129&partnerID=8YFLogxK

U2 - 10.1145/1101908.1101994

DO - 10.1145/1101908.1101994

M3 - Conference contribution

AN - SCOPUS:77952406129

SP - 440

EP - 443

BT - 20th IEEE/ACM International Conference on Automated Software Engineering, ASE 2005

T2 - 20th IEEE/ACM International Conference on Automated Software Engineering, ASE 2005

Y2 - 7 November 2005 through 11 November 2005

ER -

Constructing interaction test suites with greedy algorithms

Abstract

Other

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this