Confession session: Learning from others mistakes

P. Abshire; A. Bermak; R. Berner; G. Cauwenberghs; S. Chen; Jennifer Blain Christen; T. Constandinou; E. Culurciello; M. Dandin; T. Datta; T. Delbruck; P. Dudek; A. Eftekhar; R. Etienne-Cummings; G. Indiveri; M. K. Law; B. Linares-Barranco; J. Tapson; W. Tang; Y. Zhai

doi:10.1109/ISCAS.2011.5937774

Confession session: Learning from others mistakes

P. Abshire, A. Bermak, R. Berner, G. Cauwenberghs, S. Chen, Jennifer Blain Christen, T. Constandinou, E. Culurciello, M. Dandin, T. Datta, T. Delbruck, P. Dudek, A. Eftekhar, R. Etienne-Cummings, G. Indiveri, M. K. Law, B. Linares-Barranco, J. Tapson, W. Tang, Y. Zhai

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

People rarely put in their papers the things that didn't work, the mistakes they made, and how they found out what went wrong. Such confessions can help others learn how to avoid similar mistakes. Twenty-six confessions were collected to form the bulk of this paper. Themes that arise are errors that result from not understanding the limitations of simulation tools in modeling physical reality, chip verification errors that result from lack of clear communication between designers, and projects that are considered in their own isolated environment of technical challenges rather than the broader context of their environment or application.

Original language	English (US)
Title of host publication	2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011
Pages	1149-1162
Number of pages	14
DOIs	https://doi.org/10.1109/ISCAS.2011.5937774
State	Published - 2011
Event	2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011 - Rio de Janeiro, Brazil Duration: May 15 2011 → May 18 2011

Publication series

Name	Proceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)	0271-4310

Other

Other	2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011
Country/Territory	Brazil
City	Rio de Janeiro
Period	5/15/11 → 5/18/11

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/ISCAS.2011.5937774

Cite this

Abshire, P., Bermak, A., Berner, R., Cauwenberghs, G., Chen, S., Blain Christen, J., Constandinou, T., Culurciello, E., Dandin, M., Datta, T., Delbruck, T., Dudek, P., Eftekhar, A., Etienne-Cummings, R., Indiveri, G., Law, M. K., Linares-Barranco, B., Tapson, J., Tang, W., & Zhai, Y. (2011). Confession session: Learning from others mistakes. In 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011 (pp. 1149-1162). [5937774] (Proceedings - IEEE International Symposium on Circuits and Systems). https://doi.org/10.1109/ISCAS.2011.5937774

Abshire, P, Bermak, A, Berner, R, Cauwenberghs, G, Chen, S, Blain Christen, J, Constandinou, T, Culurciello, E, Dandin, M, Datta, T, Delbruck, T, Dudek, P, Eftekhar, A, Etienne-Cummings, R, Indiveri, G, Law, MK, Linares-Barranco, B, Tapson, J, Tang, W & Zhai, Y 2011, Confession session: Learning from others mistakes. in 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011., 5937774, Proceedings - IEEE International Symposium on Circuits and Systems, pp. 1149-1162, 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011, Rio de Janeiro, Brazil, 5/15/11. https://doi.org/10.1109/ISCAS.2011.5937774

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abstract = "People rarely put in their papers the things that didn't work, the mistakes they made, and how they found out what went wrong. Such confessions can help others learn how to avoid similar mistakes. Twenty-six confessions were collected to form the bulk of this paper. Themes that arise are errors that result from not understanding the limitations of simulation tools in modeling physical reality, chip verification errors that result from lack of clear communication between designers, and projects that are considered in their own isolated environment of technical challenges rather than the broader context of their environment or application.",

author = "P. Abshire and A. Bermak and R. Berner and G. Cauwenberghs and S. Chen and {Blain Christen}, Jennifer and T. Constandinou and E. Culurciello and M. Dandin and T. Datta and T. Delbruck and P. Dudek and A. Eftekhar and R. Etienne-Cummings and G. Indiveri and Law, {M. K.} and B. Linares-Barranco and J. Tapson and W. Tang and Y. Zhai",

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AU - Abshire, P.

AU - Bermak, A.

AU - Berner, R.

AU - Cauwenberghs, G.

AU - Chen, S.

AU - Blain Christen, Jennifer

AU - Constandinou, T.

AU - Culurciello, E.

AU - Dandin, M.

AU - Datta, T.

AU - Delbruck, T.

AU - Dudek, P.

AU - Eftekhar, A.

AU - Etienne-Cummings, R.

AU - Indiveri, G.

AU - Law, M. K.

AU - Linares-Barranco, B.

AU - Tapson, J.

AU - Tang, W.

AU - Zhai, Y.

PY - 2011

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AB - People rarely put in their papers the things that didn't work, the mistakes they made, and how they found out what went wrong. Such confessions can help others learn how to avoid similar mistakes. Twenty-six confessions were collected to form the bulk of this paper. Themes that arise are errors that result from not understanding the limitations of simulation tools in modeling physical reality, chip verification errors that result from lack of clear communication between designers, and projects that are considered in their own isolated environment of technical challenges rather than the broader context of their environment or application.

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T3 - Proceedings - IEEE International Symposium on Circuits and Systems

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EP - 1162

BT - 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011

Y2 - 15 May 2011 through 18 May 2011

ER -

Confession session: Learning from others mistakes

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