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Dive into the research topics of 'Conductive atomic force microscopy as a tool to reveal high ionising dose effects on ultra thin SiO2/Si structures'. Together they form a unique fingerprint.- Sort by
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Richard Arinero, A. D. Touboul, M. Ramonda, C. Guasch, Y. Gonzalez-Velo, J. Boch, F. Saigné
Research output: Contribution to journal › Article › peer-review