Abstract
The study of high field transport in semiconductor devices has progressed very rapidly over the past decade, sustained in part by rapid technological advances in the solid state electronics industry. These have, however, generated important conceptual problems in modeling of high speed transport in nonlinear semiconductors. Some of these problems are discussed.
Original language | English (US) |
---|---|
Pages (from-to) | 540-544 |
Number of pages | 5 |
Journal | Journal of vacuum science & technology |
Volume | 19 |
Issue number | 3 |
DOIs | |
State | Published - Sep 1981 |
Externally published | Yes |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
CONCEPTUAL PROBLEMS IN MODELING SUBMICRON DEVICE PHYSICS. / Grubin, H. L.; Ferry, D. K.
In: Journal of vacuum science & technology, Vol. 19, No. 3, 09.1981, p. 540-544.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - CONCEPTUAL PROBLEMS IN MODELING SUBMICRON DEVICE PHYSICS.
AU - Grubin, H. L.
AU - Ferry, D. K.
PY - 1981/9
Y1 - 1981/9
N2 - The study of high field transport in semiconductor devices has progressed very rapidly over the past decade, sustained in part by rapid technological advances in the solid state electronics industry. These have, however, generated important conceptual problems in modeling of high speed transport in nonlinear semiconductors. Some of these problems are discussed.
AB - The study of high field transport in semiconductor devices has progressed very rapidly over the past decade, sustained in part by rapid technological advances in the solid state electronics industry. These have, however, generated important conceptual problems in modeling of high speed transport in nonlinear semiconductors. Some of these problems are discussed.
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UR - http://www.scopus.com/inward/citedby.url?scp=0019613256&partnerID=8YFLogxK
U2 - 10.1116/1.571122
DO - 10.1116/1.571122
M3 - Article
AN - SCOPUS:0019613256
VL - 19
SP - 540
EP - 544
JO - Journal of Vacuum Science and Technology
JF - Journal of Vacuum Science and Technology
SN - 0022-5355
IS - 3
ER -