Computer control for X-ray and energy loss line profiles and images

P. Rez, C. Ahn

Research output: Contribution to journalArticle

11 Scopus citations

Abstract

A system for computer control of a TEM/STEM is described and advantages of computer control for imaging using X-ray and energy loss signals discussed. Results showing line profiles and images using analytical signals are presented.

Original languageEnglish (US)
Pages (from-to)341-350
Number of pages10
JournalUltramicroscopy
Volume8
Issue number3
DOIs
StatePublished - 1982
Externally publishedYes

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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