Computer control for X-ray and energy loss line profiles and images

Peter Rez, C. Ahn

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

A system for computer control of a TEM/STEM is described and advantages of computer control for imaging using X-ray and energy loss signals discussed. Results showing line profiles and images using analytical signals are presented.

Original languageEnglish (US)
Pages (from-to)341-350
Number of pages10
JournalUltramicroscopy
Volume8
Issue number3
DOIs
StatePublished - 1982
Externally publishedYes

Fingerprint

Computer control
Energy dissipation
energy dissipation
X rays
profiles
x rays
Transmission electron microscopy
Imaging techniques
transmission electron microscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Computer control for X-ray and energy loss line profiles and images. / Rez, Peter; Ahn, C.

In: Ultramicroscopy, Vol. 8, No. 3, 1982, p. 341-350.

Research output: Contribution to journalArticle

@article{3aede84878854734bd62408742bba4d2,
title = "Computer control for X-ray and energy loss line profiles and images",
abstract = "A system for computer control of a TEM/STEM is described and advantages of computer control for imaging using X-ray and energy loss signals discussed. Results showing line profiles and images using analytical signals are presented.",
author = "Peter Rez and C. Ahn",
year = "1982",
doi = "10.1016/0304-3991(82)90252-2",
language = "English (US)",
volume = "8",
pages = "341--350",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "3",

}

TY - JOUR

T1 - Computer control for X-ray and energy loss line profiles and images

AU - Rez, Peter

AU - Ahn, C.

PY - 1982

Y1 - 1982

N2 - A system for computer control of a TEM/STEM is described and advantages of computer control for imaging using X-ray and energy loss signals discussed. Results showing line profiles and images using analytical signals are presented.

AB - A system for computer control of a TEM/STEM is described and advantages of computer control for imaging using X-ray and energy loss signals discussed. Results showing line profiles and images using analytical signals are presented.

UR - http://www.scopus.com/inward/record.url?scp=0019986350&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0019986350&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(82)90252-2

DO - 10.1016/0304-3991(82)90252-2

M3 - Article

AN - SCOPUS:0019986350

VL - 8

SP - 341

EP - 350

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 3

ER -