@article{3aede84878854734bd62408742bba4d2,
title = "Computer control for X-ray and energy loss line profiles and images",
abstract = "A system for computer control of a TEM/STEM is described and advantages of computer control for imaging using X-ray and energy loss signals discussed. Results showing line profiles and images using analytical signals are presented.",
author = "P. Rez and C. Ahn",
note = "Funding Information: We are deeply indebted to Bob Mueller of Philips who modified the STEM unit. We should also like to thank Ian Ward and C.A. Evans for use of facilities at Evans and Associates, M. Sarikaya and P.N.T. Unwin for specimens, O.L. Krivanek, R.D. Leapman, C.E. Fiori, P.E. Batson and J.F. Konopka for helpful discussions. We are most grateful to Professor G. Thomas for his encouragement and providing funds through NSF contract DMR No. 80-23461. Research facilities were provided by the Director, Office of Energy Research, Office of Basic.E nergy Sciences, Materials Science Division of the US Department of Energy under Contract No. W-7405-ENG-48.",
year = "1982",
doi = "10.1016/0304-3991(82)90252-2",
language = "English (US)",
volume = "8",
pages = "341--350",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "3",
}