Computer-assisted extrapolation method for absorption correction in quantitative X-ray microanalysis

Z. Horita, Martha McCartney, J. K. Weiss

Research output: Contribution to journalLetter

8 Scopus citations


This letter presents results of rapid processing for X-ray absorption correction in quantitative X-ray microanalysis using an analytical electron microscope. A computer-based system developed for analytical electron microscopy is used to assist in the extrapolation method, which does not require thickness measurement but only the recording of characteristic X-rays for absorption correction.

Original languageEnglish (US)
Pages (from-to)263-265
Number of pages3
Issue number2
StatePublished - Sep 1992


ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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