Abstract
Insulators can develop different types of defects during manufacturing, mishandling and when exposed to various atmospheric conditions while in service. The type of defects commonly obtained range from voids, improper adhesion, and cracks. Timely detection of these defects is essential to avoid power supply disruption due to insulator failure. This paper presents a study to determine if defects cause significant change in the electric field along or near the insulator surface. An attempt is needed to determine defects that do and do not cause a change in electric field.
| Original language | English (US) |
|---|---|
| Title of host publication | Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report |
| Pages | 319-322 |
| Number of pages | 4 |
| State | Published - 2002 |
| Event | 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico Duration: Oct 20 2002 → Oct 24 2002 |
Other
| Other | 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena |
|---|---|
| Country/Territory | Mexico |
| City | Cancun |
| Period | 10/20/02 → 10/24/02 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Building and Construction