Computation of defect-induced electric fields on outdoor high voltage ceramic and non-ceramic insulators

R. S. Gorur, S. Sivasubramaniyam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

Insulators can develop different types of defects during manufacturing, mishandling and when exposed to various atmospheric conditions while in service. The type of defects commonly obtained range from voids, improper adhesion, and cracks. Timely detection of these defects is essential to avoid power supply disruption due to insulator failure. This paper presents a study to determine if defects cause significant change in the electric field along or near the insulator surface. An attempt is needed to determine defects that do and do not cause a change in electric field.

Original languageEnglish (US)
Title of host publicationConference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
Pages319-322
Number of pages4
StatePublished - 2002
Event2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico
Duration: Oct 20 2002Oct 24 2002

Other

Other2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena
CountryMexico
CityCancun
Period10/20/0210/24/02

Fingerprint

Electric fields
Defects
Electric potential
Adhesion
Cracks

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Building and Construction

Cite this

Gorur, R. S., & Sivasubramaniyam, S. (2002). Computation of defect-induced electric fields on outdoor high voltage ceramic and non-ceramic insulators. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report (pp. 319-322)

Computation of defect-induced electric fields on outdoor high voltage ceramic and non-ceramic insulators. / Gorur, R. S.; Sivasubramaniyam, S.

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. 2002. p. 319-322.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gorur, RS & Sivasubramaniyam, S 2002, Computation of defect-induced electric fields on outdoor high voltage ceramic and non-ceramic insulators. in Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. pp. 319-322, 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Cancun, Mexico, 10/20/02.
Gorur RS, Sivasubramaniyam S. Computation of defect-induced electric fields on outdoor high voltage ceramic and non-ceramic insulators. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. 2002. p. 319-322
Gorur, R. S. ; Sivasubramaniyam, S. / Computation of defect-induced electric fields on outdoor high voltage ceramic and non-ceramic insulators. Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. 2002. pp. 319-322
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