Computation of current-voltage characteristics in a semiconductor device using arc-length continuation

Peter A. Markowich, Christian Ringhofer, Alois Steindl

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

This paper is concerned with the computation of semiconductor device current-voltage characteristics. We describe an algorithm which allows the computation of characteristics by continuation in a parameter which approximates the arc length of the characteristic. The use of this parameterization allows the characteristic to continue beyond snap-back voltages, while continuation in the voltage fails past snap-back voltages. We discuss the implementation of the parameterization and give a numerical example.

Original languageEnglish (US)
Pages (from-to)175-187
Number of pages13
JournalIMA Journal of Applied Mathematics (Institute of Mathematics and Its Applications)
Volume33
Issue number2
DOIs
StatePublished - Sep 1984
Externally publishedYes

Fingerprint

Semiconductors
Arc length
Semiconductor Devices
Current voltage characteristics
Semiconductor devices
Continuation
parameterization
Voltage
Parameterization
Equipment and Supplies
Electric potential
Continue
Numerical Examples
semiconductor
parameter

ASJC Scopus subject areas

  • Molecular Biology
  • Statistics and Probability
  • Computational Mathematics
  • Development
  • Management, Monitoring, Policy and Law
  • Demography
  • Applied Mathematics

Cite this

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