Abstract
The composition of InxGa1-xN nanorods grown by molecular beam epitaxy with nominal x=0.5 has been mapped by electron microscopy using Z-contrast imaging and x-ray microanalysis. This shows a coherent and highly strained core-shell structure with a near-atomically sharp boundary between a Ga-rich shell (x∼0.3) and an In-rich core (x∼0.7), which itself has In- and Ga-rich platelets alternating along the growth axis. It is proposed that the shell and core regions are lateral and vertical growth sectors, with the core structure determined by spinodal decomposition.
Original language | English (US) |
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Article number | 215705 |
Journal | Nanotechnology |
Volume | 25 |
Issue number | 21 |
DOIs | |
State | Published - May 30 2014 |
Keywords
- EDX mapping
- InGaN nanorods
- core-shell structures
- molecular beam epitaxy
- spinodal decomposition
- transmission electron microscopy
ASJC Scopus subject areas
- Bioengineering
- General Chemistry
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering
- Electrical and Electronic Engineering