Compositional dependence of Raman frequencies in ternary Ge1-x-y Six Sny alloys

V. R. D'Costa, J. Tolle, C. D. Poweleit, John Kouvetakis, Jose Menendez

Research output: Contribution to journalArticle

34 Citations (Scopus)

Abstract

The Ge-Ge, Si-Si, and Si-Ge Raman frequencies in Ge1-x-y Six Sny alloys were measured for x≤0.2 and y≤0.1. The Ge-Ge and Si-Si mode frequencies are found to be linear functions of composition over the measured range. The coefficients obtained from linear fits to the experimental data are similar to those measured in binary alloys incorporating Si, Ge, or Sn, suggesting that the linear behavior extends over the entire range of possible compositions (x,y) to include the binary alloys as special cases. The linear coefficients are shown to follow a universal behavior that results from the scaling of phonon dispersion curves in Si, Ge, and α-Sn.

Original languageEnglish (US)
Article number035211
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume76
Issue number3
DOIs
StatePublished - Jul 31 2007

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Binary alloys
binary alloys
coefficients
Chemical analysis
scaling
curves

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Compositional dependence of Raman frequencies in ternary Ge1-x-y Six Sny alloys. / D'Costa, V. R.; Tolle, J.; Poweleit, C. D.; Kouvetakis, John; Menendez, Jose.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 76, No. 3, 035211, 31.07.2007.

Research output: Contribution to journalArticle

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