Complexity analysis of two-pass algorithm and elliptical weighted average filter for VLSI implementation of perspective texture warping

Sethuraman Panchanathan, K. Ramaswamy, J. J. Fang, K. Moseler, S. Levi

Research output: Contribution to journalArticle

Abstract

In this paper we present the Elliptical Weighted Average filtering algorithm and an optimized implementation of a two-pass algorithm and used in digital image and video warping. Two-pass algorithms are well suited for hardware implementation due to their reduced complexity in using 1-D re-sampling and anti-aliasing filters. But, the primary disadvantage is the need for a large buffer to store the temporary image since warping is performed in two passes. The size of the temporary buffer is equal to or greater than the size of the input image. A dedicated, hardware, implementation for this algorithm implies huge cost in terms of real estate on chip. In our approach, Wolberg-Boult's resampling algorithm is modified to use only two rows of temporary buffer thereby making the algorithm more amenable for hardware implementation. We present the complexity analysis based on number of arithmetic and logic operations (add, shift, compare, multiply, clip and divide) per macroblock. In the case of EWA filters, it is the most cost-effective high-quality filtering method because point inclusion testing can be done with one function evaluation and the filter weights can be stored in lookup tables for reduction in computation. For mapping the quadrilaterals, four equations were needed for the four lines of the quadrilaterals, which was computationally complex, wherein the computational cost was directly proportional to the number of input pixels accessed. Also we present the complexity analysis per macroblock.

Original languageEnglish (US)
Pages (from-to)330-339
Number of pages10
JournalUnknown Journal
Volume4310
DOIs
StatePublished - 2001

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very large scale integration
Systems Analysis
textures
Textures
filters
Buffers
hardware
buffers
costs
Hardware
Costs and Cost Analysis
Anti-aliasing
Costs
clips
Table lookup
Function evaluation
Surgical Instruments
logic
Pixels
pixels

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Complexity analysis of two-pass algorithm and elliptical weighted average filter for VLSI implementation of perspective texture warping. / Panchanathan, Sethuraman; Ramaswamy, K.; Fang, J. J.; Moseler, K.; Levi, S.

In: Unknown Journal, Vol. 4310, 2001, p. 330-339.

Research output: Contribution to journalArticle

@article{765effe6343d43cead5014a5fe8b6416,
title = "Complexity analysis of two-pass algorithm and elliptical weighted average filter for VLSI implementation of perspective texture warping",
abstract = "In this paper we present the Elliptical Weighted Average filtering algorithm and an optimized implementation of a two-pass algorithm and used in digital image and video warping. Two-pass algorithms are well suited for hardware implementation due to their reduced complexity in using 1-D re-sampling and anti-aliasing filters. But, the primary disadvantage is the need for a large buffer to store the temporary image since warping is performed in two passes. The size of the temporary buffer is equal to or greater than the size of the input image. A dedicated, hardware, implementation for this algorithm implies huge cost in terms of real estate on chip. In our approach, Wolberg-Boult's resampling algorithm is modified to use only two rows of temporary buffer thereby making the algorithm more amenable for hardware implementation. We present the complexity analysis based on number of arithmetic and logic operations (add, shift, compare, multiply, clip and divide) per macroblock. In the case of EWA filters, it is the most cost-effective high-quality filtering method because point inclusion testing can be done with one function evaluation and the filter weights can be stored in lookup tables for reduction in computation. For mapping the quadrilaterals, four equations were needed for the four lines of the quadrilaterals, which was computationally complex, wherein the computational cost was directly proportional to the number of input pixels accessed. Also we present the complexity analysis per macroblock.",
author = "Sethuraman Panchanathan and K. Ramaswamy and Fang, {J. J.} and K. Moseler and S. Levi",
year = "2001",
doi = "10.1117/12.411810",
language = "English (US)",
volume = "4310",
pages = "330--339",
journal = "Scanning Electron Microscopy",
issn = "0586-5581",
publisher = "Scanning Microscopy International",

}

TY - JOUR

T1 - Complexity analysis of two-pass algorithm and elliptical weighted average filter for VLSI implementation of perspective texture warping

AU - Panchanathan, Sethuraman

AU - Ramaswamy, K.

AU - Fang, J. J.

AU - Moseler, K.

AU - Levi, S.

PY - 2001

Y1 - 2001

N2 - In this paper we present the Elliptical Weighted Average filtering algorithm and an optimized implementation of a two-pass algorithm and used in digital image and video warping. Two-pass algorithms are well suited for hardware implementation due to their reduced complexity in using 1-D re-sampling and anti-aliasing filters. But, the primary disadvantage is the need for a large buffer to store the temporary image since warping is performed in two passes. The size of the temporary buffer is equal to or greater than the size of the input image. A dedicated, hardware, implementation for this algorithm implies huge cost in terms of real estate on chip. In our approach, Wolberg-Boult's resampling algorithm is modified to use only two rows of temporary buffer thereby making the algorithm more amenable for hardware implementation. We present the complexity analysis based on number of arithmetic and logic operations (add, shift, compare, multiply, clip and divide) per macroblock. In the case of EWA filters, it is the most cost-effective high-quality filtering method because point inclusion testing can be done with one function evaluation and the filter weights can be stored in lookup tables for reduction in computation. For mapping the quadrilaterals, four equations were needed for the four lines of the quadrilaterals, which was computationally complex, wherein the computational cost was directly proportional to the number of input pixels accessed. Also we present the complexity analysis per macroblock.

AB - In this paper we present the Elliptical Weighted Average filtering algorithm and an optimized implementation of a two-pass algorithm and used in digital image and video warping. Two-pass algorithms are well suited for hardware implementation due to their reduced complexity in using 1-D re-sampling and anti-aliasing filters. But, the primary disadvantage is the need for a large buffer to store the temporary image since warping is performed in two passes. The size of the temporary buffer is equal to or greater than the size of the input image. A dedicated, hardware, implementation for this algorithm implies huge cost in terms of real estate on chip. In our approach, Wolberg-Boult's resampling algorithm is modified to use only two rows of temporary buffer thereby making the algorithm more amenable for hardware implementation. We present the complexity analysis based on number of arithmetic and logic operations (add, shift, compare, multiply, clip and divide) per macroblock. In the case of EWA filters, it is the most cost-effective high-quality filtering method because point inclusion testing can be done with one function evaluation and the filter weights can be stored in lookup tables for reduction in computation. For mapping the quadrilaterals, four equations were needed for the four lines of the quadrilaterals, which was computationally complex, wherein the computational cost was directly proportional to the number of input pixels accessed. Also we present the complexity analysis per macroblock.

UR - http://www.scopus.com/inward/record.url?scp=0035062858&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035062858&partnerID=8YFLogxK

U2 - 10.1117/12.411810

DO - 10.1117/12.411810

M3 - Article

VL - 4310

SP - 330

EP - 339

JO - Scanning Electron Microscopy

JF - Scanning Electron Microscopy

SN - 0586-5581

ER -