Complex image determination in electron microscopy

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


Expressions are derived for the unaberrated complex scatttering potential of thin (<100 Å) phase objects in terms of the sum and difference of the image intensities formed in successive experiments with complementary half-plane apertures inserted in the back-focal plane of the objective lens of an electron microscope.

Original languageEnglish (US)
Pages (from-to)835-837
Number of pages3
Issue number10
StatePublished - Oct 1974
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'Complex image determination in electron microscopy'. Together they form a unique fingerprint.

Cite this