Complex image determination in electron microscopy

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Expressions are derived for the unaberrated complex scattering potential of thin (<100 Å) phase objects in terms of the sum and difference of the image intensities formed in successive experiments with complementary half plane apertures inserted in the back focal plane of the objective lens of an electron microscope.

Original languageEnglish (US)
Pages (from-to)835-837
Number of pages3
JournalOptica Acta
Volume21
Issue number10
StatePublished - 1974
Externally publishedYes

Fingerprint

half planes
Electron microscopy
Lenses
electron microscopy
Electron microscopes
electron microscopes
apertures
lenses
Scattering
scattering
Experiments

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Complex image determination in electron microscopy. / Spence, John.

In: Optica Acta, Vol. 21, No. 10, 1974, p. 835-837.

Research output: Contribution to journalArticle

@article{72c3afe4950a42adbf4a36618a2209dc,
title = "Complex image determination in electron microscopy",
abstract = "Expressions are derived for the unaberrated complex scattering potential of thin (<100 {\AA}) phase objects in terms of the sum and difference of the image intensities formed in successive experiments with complementary half plane apertures inserted in the back focal plane of the objective lens of an electron microscope.",
author = "John Spence",
year = "1974",
language = "English (US)",
volume = "21",
pages = "835--837",
journal = "Journal of Modern Optics",
issn = "0950-0340",
publisher = "Taylor and Francis Ltd.",
number = "10",

}

TY - JOUR

T1 - Complex image determination in electron microscopy

AU - Spence, John

PY - 1974

Y1 - 1974

N2 - Expressions are derived for the unaberrated complex scattering potential of thin (<100 Å) phase objects in terms of the sum and difference of the image intensities formed in successive experiments with complementary half plane apertures inserted in the back focal plane of the objective lens of an electron microscope.

AB - Expressions are derived for the unaberrated complex scattering potential of thin (<100 Å) phase objects in terms of the sum and difference of the image intensities formed in successive experiments with complementary half plane apertures inserted in the back focal plane of the objective lens of an electron microscope.

UR - http://www.scopus.com/inward/record.url?scp=0016304959&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0016304959&partnerID=8YFLogxK

M3 - Article

VL - 21

SP - 835

EP - 837

JO - Journal of Modern Optics

JF - Journal of Modern Optics

SN - 0950-0340

IS - 10

ER -