Abstract
Expressions are derived for the unaberrated complex scatttering potential of thin (<100 Å) phase objects in terms of the sum and difference of the image intensities formed in successive experiments with complementary half-plane apertures inserted in the back-focal plane of the objective lens of an electron microscope.
Original language | English (US) |
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Pages (from-to) | 835-837 |
Number of pages | 3 |
Journal | OPTICA ACTA |
Volume | 21 |
Issue number | 10 |
DOIs | |
State | Published - Oct 1974 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials