Comparison of texture evolution in Ag and Ag(Ai) alloy thin films on amorphous SiO 2

H. C. Kim, N. D. Theodore, Terry Alford

Research output: Contribution to journalArticlepeer-review

74 Scopus citations

Abstract

The textures of Ag thin films were investigated using x ray diffraction analysis as a function of the degree of agglomeration obtained by thermal annealing in vacuum. The results were compared with the textures of Ag(Al) alloy films annealed using the same conditions, and with the textures of Ag thin films those were not agglomerated. The two different changes in texture were explained using a grain growth mechanism and an agglomeration phenomenon, both of which worked to reduce the total free energy of the system at high temperature. The texture evolution of Ag films induced by agglomeration and Ag(Al) film was also discussed.

Original languageEnglish (US)
Pages (from-to)5180-5188
Number of pages9
JournalJournal of Applied Physics
Volume95
Issue number9
DOIs
StatePublished - May 1 2004

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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