Comparison of preferred orientation and stress in silver thin films on different substrates using x-ray diffraction

Physics & Astronomy

• x ray diffraction 100%
• silver 94%
• polyethylenes 62%
• thin films 59%
• textures 57%
• stress measurement 27%
• spatial distribution 20%
• poles 20%
• evaporation 17%
• conduction 15%
• diffraction 12%
• x rays 10%