Comparison and evaluation of lot-to-order matching policies for a semiconductor assembly and test facility

John Fowler, Kraig Knutson, Matt Carlyle

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

This paper is motivated by the problem of assigning semiconductor fabrication wafer lots to customer orders of various sizes. The goal of this research is to develop a method for deciding, on a given day, which orders to fill and the assignment of available lots to orders. This problem can be formulated as an integer program with a non-linear objective and non-linear constraints. Because of the complexity of this formulation, the problem is decomposed into two integer linear programs and solved in sequence by heuristic methods. In this paper, heuristic solutions are selected for the two subproblems and the performances of these heuristics are analysed in an experimental design using a representative data set. Based on this analysis, it is shown that the greedy heuristics selected perform significantly better than current practice. Finally, future research is discussed.

Original languageEnglish (US)
Pages (from-to)1841-1853
Number of pages13
JournalInternational Journal of Production Research
Volume38
Issue number8
StatePublished - May 20 2000

Fingerprint

Heuristic methods
Test facilities
Design of experiments
Semiconductor materials
Fabrication
Semiconductors
Evaluation
Heuristics

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Management Science and Operations Research

Cite this

Comparison and evaluation of lot-to-order matching policies for a semiconductor assembly and test facility. / Fowler, John; Knutson, Kraig; Carlyle, Matt.

In: International Journal of Production Research, Vol. 38, No. 8, 20.05.2000, p. 1841-1853.

Research output: Contribution to journalArticle

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