Comparing spectra from Time domain spectrometers and a polarizing Fourier transform spectrometer

G. Savini, I. Chen Ho, J. Dai, X. C. Zhang, C. Tucker, P. A.R. Ade, P. D. Mauskopf, J. Zhang, G. Zhao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We have performed a large set of spectroscopic measurements on a set of material samples and metal mesh grids with a THz Fourier transform spectrometer and two THz Time domain spectrometers. We used the statistical nature of the measurements from their repeatability and compared the results for the two different spectroscopic techniques. We find that the two systems are roughly equivalent with functional differences related to the frequencies of operation.

Original languageEnglish (US)
Title of host publicationIRMMW-THz 2010 - 35th International Conference on Infrared, Millimeter, and Terahertz Waves, Conference Guide
DOIs
StatePublished - 2010
Externally publishedYes
Event35th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2010 - Rome, Italy
Duration: Sep 5 2010Sep 10 2010

Publication series

NameIRMMW-THz 2010 - 35th International Conference on Infrared, Millimeter, and Terahertz Waves, Conference Guide

Other

Other35th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2010
Country/TerritoryItaly
CityRome
Period9/5/109/10/10

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Comparing spectra from Time domain spectrometers and a polarizing Fourier transform spectrometer'. Together they form a unique fingerprint.

Cite this