Comparing different approaches to characterization of focused X-ray laser beams

J. Chalupsky, P. Bohacek, V. Hajkova, S. P. Hau-Riege, P. A. Heimann, L. Juha, J. Krzywinski, M. Messerschmidt, S. P. Moeller, B. Nagler, M. Rowen, W. F. Schlotter, M. L. Swiggers, J. J. Turner

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