Comparative study of 28 and 18 years field aged Siemens-Arco M55 modules in temperate and hot-dry climates

Matthew Chicca, John Wohlgemuth, Govindasamy Tamizhmani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

The primary objective of this research work is two-fold: (i) determine the degradation rates of Siemens-Arco M55 modules exposed over 18 and 28 years in a hot-dry climate of Arizona and a temperate climate of California, and; (ii) identify the potential modes responsible for these degradation losses. The degradation rates were determined based on the I-V data obtained on exposed modules and on the corresponding control modules which were not exposed in the fields. The degradation modes responsible for these degradations were determined using several nondestructive tests and destructive tests performed on these control and exposed modules. The nondestructive tests included: current-voltage, visual inspection, cell-module quantum efficiency, and module level reflectance spectroscopy. The destructive tests included: transmittance spectroscopy of glass superstrates, and FTIR, DSC and TGA of encapsulant materials.

Original languageEnglish (US)
Title of host publication2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1686-1691
Number of pages6
Volume2016-November
ISBN (Electronic)9781509027248
DOIs
StatePublished - Nov 18 2016
Event43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
Duration: Jun 5 2016Jun 10 2016

Other

Other43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
CountryUnited States
CityPortland
Period6/5/166/10/16

Fingerprint

Degradation
Spectroscopy
Quantum efficiency
Inspection
Glass
Electric potential

Keywords

  • browning
  • degradation
  • destructive
  • non-destructive
  • QE
  • reflectance
  • Reliability
  • series resistance

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this

Chicca, M., Wohlgemuth, J., & Tamizhmani, G. (2016). Comparative study of 28 and 18 years field aged Siemens-Arco M55 modules in temperate and hot-dry climates. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 (Vol. 2016-November, pp. 1686-1691). [7749911] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2016.7749911

Comparative study of 28 and 18 years field aged Siemens-Arco M55 modules in temperate and hot-dry climates. / Chicca, Matthew; Wohlgemuth, John; Tamizhmani, Govindasamy.

2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Vol. 2016-November Institute of Electrical and Electronics Engineers Inc., 2016. p. 1686-1691 7749911.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chicca, M, Wohlgemuth, J & Tamizhmani, G 2016, Comparative study of 28 and 18 years field aged Siemens-Arco M55 modules in temperate and hot-dry climates. in 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. vol. 2016-November, 7749911, Institute of Electrical and Electronics Engineers Inc., pp. 1686-1691, 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States, 6/5/16. https://doi.org/10.1109/PVSC.2016.7749911
Chicca M, Wohlgemuth J, Tamizhmani G. Comparative study of 28 and 18 years field aged Siemens-Arco M55 modules in temperate and hot-dry climates. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Vol. 2016-November. Institute of Electrical and Electronics Engineers Inc. 2016. p. 1686-1691. 7749911 https://doi.org/10.1109/PVSC.2016.7749911
Chicca, Matthew ; Wohlgemuth, John ; Tamizhmani, Govindasamy. / Comparative study of 28 and 18 years field aged Siemens-Arco M55 modules in temperate and hot-dry climates. 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Vol. 2016-November Institute of Electrical and Electronics Engineers Inc., 2016. pp. 1686-1691
@inproceedings{3eb4c3771cbc4c8a8a334e53c140ab41,
title = "Comparative study of 28 and 18 years field aged Siemens-Arco M55 modules in temperate and hot-dry climates",
abstract = "The primary objective of this research work is two-fold: (i) determine the degradation rates of Siemens-Arco M55 modules exposed over 18 and 28 years in a hot-dry climate of Arizona and a temperate climate of California, and; (ii) identify the potential modes responsible for these degradation losses. The degradation rates were determined based on the I-V data obtained on exposed modules and on the corresponding control modules which were not exposed in the fields. The degradation modes responsible for these degradations were determined using several nondestructive tests and destructive tests performed on these control and exposed modules. The nondestructive tests included: current-voltage, visual inspection, cell-module quantum efficiency, and module level reflectance spectroscopy. The destructive tests included: transmittance spectroscopy of glass superstrates, and FTIR, DSC and TGA of encapsulant materials.",
keywords = "browning, degradation, destructive, non-destructive, QE, reflectance, Reliability, series resistance",
author = "Matthew Chicca and John Wohlgemuth and Govindasamy Tamizhmani",
year = "2016",
month = "11",
day = "18",
doi = "10.1109/PVSC.2016.7749911",
language = "English (US)",
volume = "2016-November",
pages = "1686--1691",
booktitle = "2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

TY - GEN

T1 - Comparative study of 28 and 18 years field aged Siemens-Arco M55 modules in temperate and hot-dry climates

AU - Chicca, Matthew

AU - Wohlgemuth, John

AU - Tamizhmani, Govindasamy

PY - 2016/11/18

Y1 - 2016/11/18

N2 - The primary objective of this research work is two-fold: (i) determine the degradation rates of Siemens-Arco M55 modules exposed over 18 and 28 years in a hot-dry climate of Arizona and a temperate climate of California, and; (ii) identify the potential modes responsible for these degradation losses. The degradation rates were determined based on the I-V data obtained on exposed modules and on the corresponding control modules which were not exposed in the fields. The degradation modes responsible for these degradations were determined using several nondestructive tests and destructive tests performed on these control and exposed modules. The nondestructive tests included: current-voltage, visual inspection, cell-module quantum efficiency, and module level reflectance spectroscopy. The destructive tests included: transmittance spectroscopy of glass superstrates, and FTIR, DSC and TGA of encapsulant materials.

AB - The primary objective of this research work is two-fold: (i) determine the degradation rates of Siemens-Arco M55 modules exposed over 18 and 28 years in a hot-dry climate of Arizona and a temperate climate of California, and; (ii) identify the potential modes responsible for these degradation losses. The degradation rates were determined based on the I-V data obtained on exposed modules and on the corresponding control modules which were not exposed in the fields. The degradation modes responsible for these degradations were determined using several nondestructive tests and destructive tests performed on these control and exposed modules. The nondestructive tests included: current-voltage, visual inspection, cell-module quantum efficiency, and module level reflectance spectroscopy. The destructive tests included: transmittance spectroscopy of glass superstrates, and FTIR, DSC and TGA of encapsulant materials.

KW - browning

KW - degradation

KW - destructive

KW - non-destructive

KW - QE

KW - reflectance

KW - Reliability

KW - series resistance

UR - http://www.scopus.com/inward/record.url?scp=85003443606&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85003443606&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2016.7749911

DO - 10.1109/PVSC.2016.7749911

M3 - Conference contribution

AN - SCOPUS:85003443606

VL - 2016-November

SP - 1686

EP - 1691

BT - 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016

PB - Institute of Electrical and Electronics Engineers Inc.

ER -