Compact Reconnaissance Imaging Spectrometer for Mars (CRISM), characterization results for instrument and focal plane subsystems

Peter R. Silverglate, Kevin J. Heffernan, Peter D. Bedini, John D. Boldt, Peter J. Cavender, Tech H. Choo, E. Hugo Darlington, Erik T. Donald, Melissa J. Fasold, Dennis E. Fort, Reid S. Gurnee, Allan T. Hayes, John R. Hayes, James B. Hemler, David C. Humm, Noam R. Izenberg, Robert E. Lee, Jeff J. Lees, David A. Lohr, Scott L. MurchieGraham A. Murphy, R. Alan Reiter, Edigio Rossano, Gordon G. Seagrave, Edward D. Schaefer, Kim Strohbehn, Howard W. Taylor, Patrick L. Thompson, Barry E. Tossman, Paul Wilson IV, Mark Robinson, Robert Green, Steven E. Mitchell

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Scopus citations

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Physics & Astronomy

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