Compact Reconnaissance Imaging Spectrometer for Mars (CRISM), characterization results for instrument and focal plane subsystems

Peter R. Silverglate, Kevin J. Heffernan, Peter D. Bedini, John D. Boldt, Peter J. Cavender, Tech H. Choo, E. Hugo Darlington, Erik T. Donald, Melissa J. Fasold, Dennis E. Fort, Reid S. Gurnee, Allan T. Hayes, John R. Hayes, James B. Hemler, David C. Humm, Noam R. Izenberg, Robert E. Lee, Jeff J. Lees, David A. Lohr, Scott L. MurchieGraham A. Murphy, R. Alan Reiter, Edigio Rossano, Gordon G. Seagrave, Edward D. Schaefer, Kim Strohbehn, Howard W. Taylor, Patrick L. Thompson, Barry E. Tossman, Paul Wilson IV, Mark Robinson, Robert Green, Steven E. Mitchell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

The Compact Reconnaissance Imaging Spectrometer for Mars (CRISM) will launch in 2005 on the Mars Reconnaissance Orbiter (MRO) mission, with its primary science objective to characterize sites with aqueous mineral deposits hyperspectrally at high spatial resolution. CRISM's two Offner relay spectrometers share a single entrance slit with a dichroic beamsplitter. The IR focal plane contains a 640 (spatial) × 480 (spectral) HgCdTe FPA with a 980 nm to 3960 nm spectral bandpass. It is cooled to 110 K to minimize dark current, and coupled to a 28 mm long cold shield to minimize thermal background. The spectrometer housing is cooled to -90C for the same reason. A three-zone IR filter consisting of two broadband filters and a linear variable filter overlays the IR focal plane, eliminating multiple grating orders and providing additional attenuation of the thermal background. The visible focal plane contains a 640 (spatial) × 480 (spectral) silicon photodiode array, with a 380-1050 nm spectral bandpass occupying approximately 106 rows of the detector. A two-zone filter comprised of two different Schott glasses eliminates multiple grating orders. The two focal planes together cover 544 spectral channels with a dispersion of 6.55 nm/channel in the VNIR and 6.63 nm/channel in the IR. The optics and focal planes are gimbaled, and a pre-programmed slew can be used to remove groundtrack motion while superimposing a scan across a target. CRISM will operate in two basic modes: a scanning, high resolution mode to hyperspectrally map small, targeted areas of high scientific interest, and a fixed, nadir-pointed, lower resolution pixel-binned mode using selected wavelength channels to obtain near-global coverage to find targets. Preliminary performance of the CRISM instrument is presented, and is compared with prior system design predictions.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsE.L. Dereniak, R.E. Sampson, C.B. Johnson
Pages98-100
Number of pages3
Volume5563
DOIs
StatePublished - 2004
Externally publishedYes
EventInfrared Systems and Photoelectronics Technology - Denver, CO, United States
Duration: Aug 2 2004Aug 5 2004

Other

OtherInfrared Systems and Photoelectronics Technology
CountryUnited States
CityDenver, CO
Period8/2/048/5/04

Fingerprint

reconnaissance
imaging spectrometers
mars
Spectrometers
Imaging techniques
filters
Mars Reconnaissance Orbiter
gratings
spectrometers
mineral deposits
high resolution
relay
dark current
Mineral resources
systems engineering
entrances
Dark currents
photodiodes
slits
Photodiodes

Keywords

  • Hyperspectral imaging
  • Imaging spectrometry
  • Mars
  • Planetary instruments
  • Remote sensing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Silverglate, P. R., Heffernan, K. J., Bedini, P. D., Boldt, J. D., Cavender, P. J., Choo, T. H., ... Mitchell, S. E. (2004). Compact Reconnaissance Imaging Spectrometer for Mars (CRISM), characterization results for instrument and focal plane subsystems. In E. L. Dereniak, R. E. Sampson, & C. B. Johnson (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5563, pp. 98-100). [18] https://doi.org/10.1117/12.559882

Compact Reconnaissance Imaging Spectrometer for Mars (CRISM), characterization results for instrument and focal plane subsystems. / Silverglate, Peter R.; Heffernan, Kevin J.; Bedini, Peter D.; Boldt, John D.; Cavender, Peter J.; Choo, Tech H.; Darlington, E. Hugo; Donald, Erik T.; Fasold, Melissa J.; Fort, Dennis E.; Gurnee, Reid S.; Hayes, Allan T.; Hayes, John R.; Hemler, James B.; Humm, David C.; Izenberg, Noam R.; Lee, Robert E.; Lees, Jeff J.; Lohr, David A.; Murchie, Scott L.; Murphy, Graham A.; Reiter, R. Alan; Rossano, Edigio; Seagrave, Gordon G.; Schaefer, Edward D.; Strohbehn, Kim; Taylor, Howard W.; Thompson, Patrick L.; Tossman, Barry E.; Wilson IV, Paul; Robinson, Mark; Green, Robert; Mitchell, Steven E.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / E.L. Dereniak; R.E. Sampson; C.B. Johnson. Vol. 5563 2004. p. 98-100 18.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silverglate, PR, Heffernan, KJ, Bedini, PD, Boldt, JD, Cavender, PJ, Choo, TH, Darlington, EH, Donald, ET, Fasold, MJ, Fort, DE, Gurnee, RS, Hayes, AT, Hayes, JR, Hemler, JB, Humm, DC, Izenberg, NR, Lee, RE, Lees, JJ, Lohr, DA, Murchie, SL, Murphy, GA, Reiter, RA, Rossano, E, Seagrave, GG, Schaefer, ED, Strohbehn, K, Taylor, HW, Thompson, PL, Tossman, BE, Wilson IV, P, Robinson, M, Green, R & Mitchell, SE 2004, Compact Reconnaissance Imaging Spectrometer for Mars (CRISM), characterization results for instrument and focal plane subsystems. in EL Dereniak, RE Sampson & CB Johnson (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5563, 18, pp. 98-100, Infrared Systems and Photoelectronics Technology, Denver, CO, United States, 8/2/04. https://doi.org/10.1117/12.559882
Silverglate PR, Heffernan KJ, Bedini PD, Boldt JD, Cavender PJ, Choo TH et al. Compact Reconnaissance Imaging Spectrometer for Mars (CRISM), characterization results for instrument and focal plane subsystems. In Dereniak EL, Sampson RE, Johnson CB, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5563. 2004. p. 98-100. 18 https://doi.org/10.1117/12.559882
Silverglate, Peter R. ; Heffernan, Kevin J. ; Bedini, Peter D. ; Boldt, John D. ; Cavender, Peter J. ; Choo, Tech H. ; Darlington, E. Hugo ; Donald, Erik T. ; Fasold, Melissa J. ; Fort, Dennis E. ; Gurnee, Reid S. ; Hayes, Allan T. ; Hayes, John R. ; Hemler, James B. ; Humm, David C. ; Izenberg, Noam R. ; Lee, Robert E. ; Lees, Jeff J. ; Lohr, David A. ; Murchie, Scott L. ; Murphy, Graham A. ; Reiter, R. Alan ; Rossano, Edigio ; Seagrave, Gordon G. ; Schaefer, Edward D. ; Strohbehn, Kim ; Taylor, Howard W. ; Thompson, Patrick L. ; Tossman, Barry E. ; Wilson IV, Paul ; Robinson, Mark ; Green, Robert ; Mitchell, Steven E. / Compact Reconnaissance Imaging Spectrometer for Mars (CRISM), characterization results for instrument and focal plane subsystems. Proceedings of SPIE - The International Society for Optical Engineering. editor / E.L. Dereniak ; R.E. Sampson ; C.B. Johnson. Vol. 5563 2004. pp. 98-100
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