Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images

R. Holmestad, O. L. Krivanek, R. Høier, K. Marthinsen, John Spence

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

A commercial parallel electron energy loss spectrometer (PEELS) system has been modified to allow it to record, line by line, two-dimensional energy-filtered electron diffraction patterns or images. The results given for convergent beam electron diffraction patterns in silicon show that the performance of the system is intermediate between that of an imaging energy filter (such as an omega filter) and a serial scanned readout Grigson system.

Original languageEnglish (US)
Pages (from-to)454-458
Number of pages5
JournalUltramicroscopy
Volume52
Issue number3-4
DOIs
StatePublished - 1993

Fingerprint

Electron diffraction
Diffraction patterns
Spectrometers
diffraction patterns
electron diffraction
spectrometers
Readout systems
filters
Silicon
readout
Energy dissipation
energy dissipation
electron energy
Imaging techniques
energy
Electrons
silicon

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images. / Holmestad, R.; Krivanek, O. L.; Høier, R.; Marthinsen, K.; Spence, John.

In: Ultramicroscopy, Vol. 52, No. 3-4, 1993, p. 454-458.

Research output: Contribution to journalArticle

Holmestad, R. ; Krivanek, O. L. ; Høier, R. ; Marthinsen, K. ; Spence, John. / Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images. In: Ultramicroscopy. 1993 ; Vol. 52, No. 3-4. pp. 454-458.
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