Combined effects of shunt and luminescence coupling on external quantum efficiency measurements of multijunction solar cells

Jing Jing Li; Swee Hoe Lim; Charles R. Allen; Ding Ding; Yong-Hang Zhang

doi:10.1109/JPHOTOV.2011.2172188

Combined effects of shunt and luminescence coupling on external quantum efficiency measurements of multijunction solar cells

Jing Jing Li, Swee Hoe Lim, Charles R. Allen, Ding Ding, Yong-Hang Zhang

Research output: Contribution to journal › Article › peer-review

47 Scopus citations

Abstract

The combined effects of shunt and luminescence coupling on the measurement artifact of external quantum efficiency (EQE) of multi-junction solar cells are studied. The EQE measurement artifact is modeled using DC and small-signal equivalent circuits under voltage and light bias conditions. The modeling results are verified with EQE measurements of a Ge bottom cell of a triple-junction solar cell. It is found that the optimal bias light intensity to minimize the EQE measurement artifact is the result of the tradeoff between the shunt and the luminescence coupling effects.

Original language	English (US)
Article number	6087996
Pages (from-to)	225-230
Number of pages	6
Journal	IEEE Journal of Photovoltaics
Volume	1
Issue number	2
DOIs	https://doi.org/10.1109/JPHOTOV.2011.2172188
State	Published - 2011

Keywords

Luminescence coupling
multi-junction solar cells
quantum efficiency
shunt

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/JPHOTOV.2011.2172188

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title = "Combined effects of shunt and luminescence coupling on external quantum efficiency measurements of multijunction solar cells",

abstract = "The combined effects of shunt and luminescence coupling on the measurement artifact of external quantum efficiency (EQE) of multi-junction solar cells are studied. The EQE measurement artifact is modeled using DC and small-signal equivalent circuits under voltage and light bias conditions. The modeling results are verified with EQE measurements of a Ge bottom cell of a triple-junction solar cell. It is found that the optimal bias light intensity to minimize the EQE measurement artifact is the result of the tradeoff between the shunt and the luminescence coupling effects.",

keywords = "Luminescence coupling, multi-junction solar cells, quantum efficiency, shunt",

author = "Li, {Jing Jing} and Lim, {Swee Hoe} and Allen, {Charles R.} and Ding Ding and Yong-Hang Zhang",

note = "Funding Information: Manuscript received July 18, 2011; revised September 27, 2011; accepted October 7, 2011. Date of publication November 28, 2011; date of current version December 27, 2011. This work was supported in part by the Science Foundation Arizona under Contract SRG 0190-07 and Contract SRG 0339-08, the Air Force Research Laboratory/Space Vehicles Directorate under Contract FA9453-08-2-0228, a National Science Foundation Grant under Contract 1002114, and by Newport Corporation.",

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doi = "10.1109/JPHOTOV.2011.2172188",

language = "English (US)",

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AU - Allen, Charles R.

AU - Ding, Ding

AU - Zhang, Yong-Hang

N1 - Funding Information: Manuscript received July 18, 2011; revised September 27, 2011; accepted October 7, 2011. Date of publication November 28, 2011; date of current version December 27, 2011. This work was supported in part by the Science Foundation Arizona under Contract SRG 0190-07 and Contract SRG 0339-08, the Air Force Research Laboratory/Space Vehicles Directorate under Contract FA9453-08-2-0228, a National Science Foundation Grant under Contract 1002114, and by Newport Corporation.

PY - 2011

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N2 - The combined effects of shunt and luminescence coupling on the measurement artifact of external quantum efficiency (EQE) of multi-junction solar cells are studied. The EQE measurement artifact is modeled using DC and small-signal equivalent circuits under voltage and light bias conditions. The modeling results are verified with EQE measurements of a Ge bottom cell of a triple-junction solar cell. It is found that the optimal bias light intensity to minimize the EQE measurement artifact is the result of the tradeoff between the shunt and the luminescence coupling effects.

AB - The combined effects of shunt and luminescence coupling on the measurement artifact of external quantum efficiency (EQE) of multi-junction solar cells are studied. The EQE measurement artifact is modeled using DC and small-signal equivalent circuits under voltage and light bias conditions. The modeling results are verified with EQE measurements of a Ge bottom cell of a triple-junction solar cell. It is found that the optimal bias light intensity to minimize the EQE measurement artifact is the result of the tradeoff between the shunt and the luminescence coupling effects.

KW - Luminescence coupling

KW - multi-junction solar cells

KW - quantum efficiency

KW - shunt

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Combined effects of shunt and luminescence coupling on external quantum efficiency measurements of multijunction solar cells

Abstract

Keywords

ASJC Scopus subject areas

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