Coincidence experiments in desorption mass spectrometry

C. W. Diehnelt, R. D. English, M. J. Van Stipdonk, E. A. Schweikert

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

The detection of coincidental signals can enhance the amount of information available in desorption time-of-flight mass spectrometry (TOF-MS) by identifying physical, chemical and/or spatial correlations between secondary ions. Detection of coincidental emissions requires that the target surface be bombarded with individual primary ions (keV or MeV), each resolved in time and space. This paper will discuss the application of coincidence counting to TOF-MS to: extract the secondary ion mass spectrum and secondary ion yields from an organic target produced by a single primary ion type when multiple primary ions simultaneously impact the sample; examine the metastable dissociation pathways and decay fractions of organic secondary ions using an ion-neutral correlation method; and study the chemical microhomogeneity (on the sub-μm scale) of a surface composed of two chemically distinct species.

Original languageEnglish (US)
Pages (from-to)883-890
Number of pages8
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume193
Issue number1-4
DOIs
StatePublished - Jun 1 2002
Externally publishedYes

Keywords

  • Desorption
  • Metastability
  • Polyatomic primary ions
  • Secondary ion mass spectrometry

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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