Coherent X-ray spectroscopy reveals the persistence of island arrangements during layer-by-layer growth

Guangxu Ju; Dongwei Xu; Matthew J. Highland; Carol Thompson; Hua Zhou; Jeffrey A. Eastman; Paul H. Fuoss; Peter Zapol; Hyunjung Kim; G. Brian Stephenson

doi:10.1038/s41567-019-0448-1

Coherent X-ray spectroscopy reveals the persistence of island arrangements during layer-by-layer growth

Guangxu Ju, Dongwei Xu, Matthew J. Highland, Carol Thompson, Hua Zhou, Jeffrey A. Eastman, Paul H. Fuoss, Peter Zapol, Hyunjung Kim, G. Brian Stephenson

Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

Understanding surface dynamics during epitaxial film growth is key to growing high-quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) using coherent X-rays opens new opportunities for in situ observation of atomic-scale fluctuation dynamics during crystal growth. Here, we present XPCS measurements of two-dimensional island dynamics during homoepitaxial growth in the layer-by-layer mode. Analysis of the results using two-time correlations reveals a new phenomenon—a memory effect in the arrangement of islands formed on successive crystal layers. Simulations indicate that this persistence in the island arrangements arises from communication between islands on different layers via adatoms. With the worldwide advent of new coherent X-ray sources, the experimental and analysis methods pioneered here will enable broad application of XPCS to observe atomic-scale processes on surfaces.

Original language	English (US)
Pages (from-to)	589-594
Number of pages	6
Journal	Nature Physics
Volume	15
Issue number	6
DOIs	https://doi.org/10.1038/s41567-019-0448-1
State	Published - Jun 1 2019

ASJC Scopus subject areas

General Physics and Astronomy

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title = "Coherent X-ray spectroscopy reveals the persistence of island arrangements during layer-by-layer growth",

abstract = "Understanding surface dynamics during epitaxial film growth is key to growing high-quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) using coherent X-rays opens new opportunities for in situ observation of atomic-scale fluctuation dynamics during crystal growth. Here, we present XPCS measurements of two-dimensional island dynamics during homoepitaxial growth in the layer-by-layer mode. Analysis of the results using two-time correlations reveals a new phenomenon—a memory effect in the arrangement of islands formed on successive crystal layers. Simulations indicate that this persistence in the island arrangements arises from communication between islands on different layers via adatoms. With the worldwide advent of new coherent X-ray sources, the experimental and analysis methods pioneered here will enable broad application of XPCS to observe atomic-scale processes on surfaces.",

author = "Guangxu Ju and Dongwei Xu and Highland, {Matthew J.} and Carol Thompson and Hua Zhou and Eastman, {Jeffrey A.} and Fuoss, {Paul H.} and Peter Zapol and Hyunjung Kim and Stephenson, {G. Brian}",

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doi = "10.1038/s41567-019-0448-1",

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T1 - Coherent X-ray spectroscopy reveals the persistence of island arrangements during layer-by-layer growth

AU - Ju, Guangxu

AU - Xu, Dongwei

AU - Highland, Matthew J.

AU - Thompson, Carol

AU - Zhou, Hua

AU - Eastman, Jeffrey A.

AU - Fuoss, Paul H.

AU - Zapol, Peter

AU - Kim, Hyunjung

AU - Stephenson, G. Brian

PY - 2019/6/1

Y1 - 2019/6/1

N2 - Understanding surface dynamics during epitaxial film growth is key to growing high-quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) using coherent X-rays opens new opportunities for in situ observation of atomic-scale fluctuation dynamics during crystal growth. Here, we present XPCS measurements of two-dimensional island dynamics during homoepitaxial growth in the layer-by-layer mode. Analysis of the results using two-time correlations reveals a new phenomenon—a memory effect in the arrangement of islands formed on successive crystal layers. Simulations indicate that this persistence in the island arrangements arises from communication between islands on different layers via adatoms. With the worldwide advent of new coherent X-ray sources, the experimental and analysis methods pioneered here will enable broad application of XPCS to observe atomic-scale processes on surfaces.

AB - Understanding surface dynamics during epitaxial film growth is key to growing high-quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) using coherent X-rays opens new opportunities for in situ observation of atomic-scale fluctuation dynamics during crystal growth. Here, we present XPCS measurements of two-dimensional island dynamics during homoepitaxial growth in the layer-by-layer mode. Analysis of the results using two-time correlations reveals a new phenomenon—a memory effect in the arrangement of islands formed on successive crystal layers. Simulations indicate that this persistence in the island arrangements arises from communication between islands on different layers via adatoms. With the worldwide advent of new coherent X-ray sources, the experimental and analysis methods pioneered here will enable broad application of XPCS to observe atomic-scale processes on surfaces.

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Coherent X-ray spectroscopy reveals the persistence of island arrangements during layer-by-layer growth

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