Coherent electron nanodiffraction from clean silver nano particles in a UHV STEM

Jingyue Liu, M. Pan, G. E. Spinnler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Small metal particles have peculiar chemical and physical properties and they are especially important in catalysis. The structural characterization of small particles is of primary importance for the understanding of structure-catalytic activity relationships. Coherent electron nanodiffraction (CEND) patterns from nano particles contain information about the particle size, shape, structure and defects, etc. As part of an on-going program of STEM characterization of supported catalysts, the paper reports some preliminary results of CEND study of Ag nano particles, deposited in situ in a UHV STEM instrument. The experimental results with full dynamical simulations are compared in order to extract information about the shape of Ag nano particles.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Pages1058-1059
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

Other

OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA
Period8/1/938/6/93

Fingerprint

Silver
Electrons
Catalyst supports
Chemical properties
Catalysis
Catalyst activity
Physical properties
Particle size
Defects
Metals

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Liu, J., Pan, M., & Spinnler, G. E. (1993). Coherent electron nanodiffraction from clean silver nano particles in a UHV STEM. In Proceedings - Annual Meeting, Microscopy Society of America (pp. 1058-1059). Publ by San Francisco Press Inc.

Coherent electron nanodiffraction from clean silver nano particles in a UHV STEM. / Liu, Jingyue; Pan, M.; Spinnler, G. E.

Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. p. 1058-1059.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Liu, J, Pan, M & Spinnler, GE 1993, Coherent electron nanodiffraction from clean silver nano particles in a UHV STEM. in Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, pp. 1058-1059, Proceedings of the 51st Annual Meeting Microscopy Society of America, Cincinnati, OH, USA, 8/1/93.
Liu J, Pan M, Spinnler GE. Coherent electron nanodiffraction from clean silver nano particles in a UHV STEM. In Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc. 1993. p. 1058-1059
Liu, Jingyue ; Pan, M. ; Spinnler, G. E. / Coherent electron nanodiffraction from clean silver nano particles in a UHV STEM. Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. pp. 1058-1059
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