Coherent diffractive imaging with X-rays and electrons

John Spence, M. R. Howells

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Due to a fusion of ideas from several disciplines, it is now often possible to numerically retrieve the apparently lost phases from a recording of the intensity diffracted from an unknown object. This opens the possibility to develop forms of microscopy based on illumination by coherent beams produced either by a field emission gun in an electron microscope or by an undulator on an electron storage ring. Both of these approaches have now been demonstrated and a community is growing up to exploit these evolving techniques. In this paper we discuss the historical developments which have made this possible and describe the progress so far and some of the future prospects.

Original languageEnglish (US)
Title of host publicationSynchrotron Radiation Instrumentation
Subtitle of host publication8th International Conference on Synchrotron Radiation Instrumentation
PublisherAmerican Institute of Physics Inc.
Pages1372-1375
Number of pages4
ISBN (Electronic)0735401799
DOIs
StatePublished - May 12 2004
Event8th International Conference on Synchrotron Radiation Instrumentation - San Francisco, United States
Duration: Aug 25 2003Aug 29 2003

Publication series

NameAIP Conference Proceedings
Volume705
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other8th International Conference on Synchrotron Radiation Instrumentation
CountryUnited States
CitySan Francisco
Period8/25/038/29/03

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Spence, J., & Howells, M. R. (2004). Coherent diffractive imaging with X-rays and electrons. In Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation (pp. 1372-1375). (AIP Conference Proceedings; Vol. 705). American Institute of Physics Inc.. https://doi.org/10.1063/1.1758057