Coherent diffractive imaging with X-rays and electrons

John Spence, M. R. Howells

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Due to a fusion of ideas from several disciplines, it is now often possible to numerically retrieve the apparently lost phases from a recording of the intensity diffracted from an unknown object. This opens the possibility to develop forms of microscopy based on illumination by coherent beams produced either by a field emission gun in an electron microscope or by an undulator on an electron storage ring. Both of these approaches have now been demonstrated and a community is growing up to exploit these evolving techniques. In this paper we discuss the historical developments which have made this possible and describe the progress so far and some of the future prospects.

Original languageEnglish (US)
Title of host publicationSynchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation
PublisherAmerican Institute of Physics Inc.
Pages1372-1375
Number of pages4
Volume705
ISBN (Electronic)0735401799
DOIs
StatePublished - May 12 2004
Event8th International Conference on Synchrotron Radiation Instrumentation - San Francisco, United States
Duration: Aug 25 2003Aug 29 2003

Other

Other8th International Conference on Synchrotron Radiation Instrumentation
CountryUnited States
CitySan Francisco
Period8/25/038/29/03

Fingerprint

field emission
electron microscopes
fusion
recording
illumination
microscopy
electrons
x rays

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Spence, J., & Howells, M. R. (2004). Coherent diffractive imaging with X-rays and electrons. In Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation (Vol. 705, pp. 1372-1375). American Institute of Physics Inc.. https://doi.org/10.1063/1.1758057

Coherent diffractive imaging with X-rays and electrons. / Spence, John; Howells, M. R.

Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. Vol. 705 American Institute of Physics Inc., 2004. p. 1372-1375.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Spence, J & Howells, MR 2004, Coherent diffractive imaging with X-rays and electrons. in Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. vol. 705, American Institute of Physics Inc., pp. 1372-1375, 8th International Conference on Synchrotron Radiation Instrumentation, San Francisco, United States, 8/25/03. https://doi.org/10.1063/1.1758057
Spence J, Howells MR. Coherent diffractive imaging with X-rays and electrons. In Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. Vol. 705. American Institute of Physics Inc. 2004. p. 1372-1375 https://doi.org/10.1063/1.1758057
Spence, John ; Howells, M. R. / Coherent diffractive imaging with X-rays and electrons. Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. Vol. 705 American Institute of Physics Inc., 2004. pp. 1372-1375
@inproceedings{443bedcb07b04f01b9da85d495b969ce,
title = "Coherent diffractive imaging with X-rays and electrons",
abstract = "Due to a fusion of ideas from several disciplines, it is now often possible to numerically retrieve the apparently lost phases from a recording of the intensity diffracted from an unknown object. This opens the possibility to develop forms of microscopy based on illumination by coherent beams produced either by a field emission gun in an electron microscope or by an undulator on an electron storage ring. Both of these approaches have now been demonstrated and a community is growing up to exploit these evolving techniques. In this paper we discuss the historical developments which have made this possible and describe the progress so far and some of the future prospects.",
author = "John Spence and Howells, {M. R.}",
year = "2004",
month = "5",
day = "12",
doi = "10.1063/1.1758057",
language = "English (US)",
volume = "705",
pages = "1372--1375",
booktitle = "Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation",
publisher = "American Institute of Physics Inc.",

}

TY - GEN

T1 - Coherent diffractive imaging with X-rays and electrons

AU - Spence, John

AU - Howells, M. R.

PY - 2004/5/12

Y1 - 2004/5/12

N2 - Due to a fusion of ideas from several disciplines, it is now often possible to numerically retrieve the apparently lost phases from a recording of the intensity diffracted from an unknown object. This opens the possibility to develop forms of microscopy based on illumination by coherent beams produced either by a field emission gun in an electron microscope or by an undulator on an electron storage ring. Both of these approaches have now been demonstrated and a community is growing up to exploit these evolving techniques. In this paper we discuss the historical developments which have made this possible and describe the progress so far and some of the future prospects.

AB - Due to a fusion of ideas from several disciplines, it is now often possible to numerically retrieve the apparently lost phases from a recording of the intensity diffracted from an unknown object. This opens the possibility to develop forms of microscopy based on illumination by coherent beams produced either by a field emission gun in an electron microscope or by an undulator on an electron storage ring. Both of these approaches have now been demonstrated and a community is growing up to exploit these evolving techniques. In this paper we discuss the historical developments which have made this possible and describe the progress so far and some of the future prospects.

UR - http://www.scopus.com/inward/record.url?scp=84862926682&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84862926682&partnerID=8YFLogxK

U2 - 10.1063/1.1758057

DO - 10.1063/1.1758057

M3 - Conference contribution

AN - SCOPUS:84862926682

VL - 705

SP - 1372

EP - 1375

BT - Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation

PB - American Institute of Physics Inc.

ER -