COHERENT BREMSSTRAHLUNG PEAKS IN X-RAY MICROANALYSIS SPECTRA.

John Spence, G. Reese, N. Yamamoto, G. Kurizki

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

Coherent bremsstrahlung peaks have been detected in X-ray microanalysis spectra in transmission electron microscopy. The dependence of the peak energy on crystallographic orientation and incident beam energy is used to confirm the identification. These peaks may mask peaks due to elements sought in microanalysis.

Original languageEnglish (US)
JournalPhilosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties
Volume48
Issue number4
StatePublished - Oct 1983

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Microanalysis
X rays
Masks
Transmission electron microscopy

ASJC Scopus subject areas

  • Engineering(all)

Cite this

COHERENT BREMSSTRAHLUNG PEAKS IN X-RAY MICROANALYSIS SPECTRA. / Spence, John; Reese, G.; Yamamoto, N.; Kurizki, G.

In: Philosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties, Vol. 48, No. 4, 10.1983.

Research output: Contribution to journalArticle

@article{73e801e096264c9c9008986dc43de47e,
title = "COHERENT BREMSSTRAHLUNG PEAKS IN X-RAY MICROANALYSIS SPECTRA.",
abstract = "Coherent bremsstrahlung peaks have been detected in X-ray microanalysis spectra in transmission electron microscopy. The dependence of the peak energy on crystallographic orientation and incident beam energy is used to confirm the identification. These peaks may mask peaks due to elements sought in microanalysis.",
author = "John Spence and G. Reese and N. Yamamoto and G. Kurizki",
year = "1983",
month = "10",
language = "English (US)",
volume = "48",
journal = "Philosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties",
issn = "0141-8637",
publisher = "Taylor and Francis Ltd.",
number = "4",

}

TY - JOUR

T1 - COHERENT BREMSSTRAHLUNG PEAKS IN X-RAY MICROANALYSIS SPECTRA.

AU - Spence, John

AU - Reese, G.

AU - Yamamoto, N.

AU - Kurizki, G.

PY - 1983/10

Y1 - 1983/10

N2 - Coherent bremsstrahlung peaks have been detected in X-ray microanalysis spectra in transmission electron microscopy. The dependence of the peak energy on crystallographic orientation and incident beam energy is used to confirm the identification. These peaks may mask peaks due to elements sought in microanalysis.

AB - Coherent bremsstrahlung peaks have been detected in X-ray microanalysis spectra in transmission electron microscopy. The dependence of the peak energy on crystallographic orientation and incident beam energy is used to confirm the identification. These peaks may mask peaks due to elements sought in microanalysis.

UR - http://www.scopus.com/inward/record.url?scp=0020831595&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020831595&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0020831595

VL - 48

JO - Philosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties

JF - Philosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties

SN - 0141-8637

IS - 4

ER -