Coherent bremsstrahlung peaks in x-ray microanalysis spectra

John Spence, G. Reese, N. Yamamoto, G. Kurizki

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

Coherent bremsstrahlung peaks have been detected in X-ray microanalysis spectra in transmission electron microscopy. The dependence of the peak energy on crystallographic orientation and incident beam energy is used to confirm the identification. These peaks may mask peaks due to elements sought in microanalysis.

Original languageEnglish (US)
Pages (from-to)L39-L43
JournalPhilosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
Volume48
Issue number4
DOIs
StatePublished - Oct 1983

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Physics and Astronomy(all)

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