COHERENT BREMSSTRAHLUNG PEAKS IN X-RAY MICROANALYSIS SPECTRA.

John Spence, G. Reese, N. Yamamoto, G. Kurizki

Research output: Contribution to journalArticle

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Abstract

Coherent bremsstrahlung peaks have been detected in X-ray microanalysis spectra in transmission electron microscopy. The dependence of the peak energy on crystallographic orientation and incident beam energy is used to confirm the identification. These peaks may mask peaks due to elements sought in microanalysis.

Original languageEnglish (US)
JournalPhilosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties
Volume48
Issue number4
Publication statusPublished - Oct 1983

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ASJC Scopus subject areas

  • Engineering(all)

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