Coherent bremsstrahlung peaks have been detected in X-ray microanalysis spectra in transmission electron microscopy. The dependence of the peak energy on crystallographic orientation and incident beam energy is used to confirm the identification. These peaks may mask peaks due to elements sought in microanalysis.
|Original language||English (US)|
|Journal||Philosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties|
|Publication status||Published - Oct 1983|
ASJC Scopus subject areas