CMOS compatible SOI MESFETs for wide temperature range electronics

Trevor Thornton, J. Ervin, A. Balijepalli, A. Shanmugam, W. Lepkowski, Keith Holbert, Bertan Bakkaloglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

A standard silicon-on-insulator (SOI) CMOS process has been used to fabricate metal-semiconductor field-effect transistors (MESFETs). MESFETs with gate lengths as small as 0.4 microns were demonstrated. The devices have been tested at room temperature in the frequency range DC to 20 GHz. Excellent DC and small-signal transfer characteristics were obtained with device breakdown voltages greatly exceeding those of the CMOS devices. The DC parameters of the device were measured over the temperature range -196°C to +150°C and used to develop a TOM3 Spice model that accurately describes MESFET operation over the entire temperature range. We have used the model to demonstrate a number of SOI MESFET based circuits including an operational amplifier and a proportional-to-absolute-temperature (PTAT) voltage source. Measurements of the device after irradiation with up to 100 krad(Si) x-rays show a 20 mV shift in the threshold voltage. The results demonstrate that SOI MESFETs may be a viable technology for analog and mixed signal circuits that are required to operate in the Moon and Mars environments.

Original languageEnglish (US)
Title of host publication2007 IEEE Aerospace Conference Digest
DOIs
StatePublished - Sep 24 2007
Event2007 IEEE Aerospace Conference - Big Sky, MT, United States
Duration: Mar 3 2007Mar 10 2007

Publication series

NameIEEE Aerospace Conference Proceedings
ISSN (Print)1095-323X

Other

Other2007 IEEE Aerospace Conference
CountryUnited States
CityBig Sky, MT
Period3/3/073/10/07

ASJC Scopus subject areas

  • Aerospace Engineering
  • Space and Planetary Science

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  • Cite this

    Thornton, T., Ervin, J., Balijepalli, A., Shanmugam, A., Lepkowski, W., Holbert, K., & Bakkaloglu, B. (2007). CMOS compatible SOI MESFETs for wide temperature range electronics. In 2007 IEEE Aerospace Conference Digest [4161531] (IEEE Aerospace Conference Proceedings). https://doi.org/10.1109/AERO.2007.352653