Classical and quantum transport in focused-ion-beam-deposited Pt nanointerconnects

J. F. Lin, J. P. Bird, L. Rotkina, Peter Bennett

Research output: Contribution to journalArticle

79 Citations (Scopus)

Abstract

A study was performed on classical and quantum transport in Pt nanointerconnects. Pt nanointerconnects were formed on SiO2 substrates by focused-ion-beam-deposition. A small residual-resistivity ratio and a Debye temperature that differed significantly from that of pure Pt was revealed by the studies of their temperature-dependent resistivity.

Original languageEnglish (US)
Pages (from-to)802-804
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number5
DOIs
StatePublished - Feb 3 2003

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ion beams
electrical resistivity
specific heat
temperature

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Classical and quantum transport in focused-ion-beam-deposited Pt nanointerconnects. / Lin, J. F.; Bird, J. P.; Rotkina, L.; Bennett, Peter.

In: Applied Physics Letters, Vol. 82, No. 5, 03.02.2003, p. 802-804.

Research output: Contribution to journalArticle

Lin, J. F. ; Bird, J. P. ; Rotkina, L. ; Bennett, Peter. / Classical and quantum transport in focused-ion-beam-deposited Pt nanointerconnects. In: Applied Physics Letters. 2003 ; Vol. 82, No. 5. pp. 802-804.
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