TY - BOOK
T1 - Circuit design for reliability
AU - Reis, Ricardo
AU - Wirth, Gilson
AU - Cao, Yu
N1 - Publisher Copyright:
© Springer Science+Business Media New York 2015.
PY - 2015/1/1
Y1 - 2015/1/1
N2 - This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
AB - This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
UR - http://www.scopus.com/inward/record.url?scp=84944256488&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84944256488&partnerID=8YFLogxK
U2 - 10.1007/978-1-4614-4078-9
DO - 10.1007/978-1-4614-4078-9
M3 - Book
AN - SCOPUS:84944256488
SN - 9781461440772
BT - Circuit design for reliability
PB - Springer New York
ER -