Abstract

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Original languageEnglish (US)
PublisherSpringer New York
Number of pages272
ISBN (Print)9781461440789, 9781461440772
DOIs
StatePublished - Jan 1 2015

Fingerprint

Networks (circuits)
Electric network analysis
Fault detection
Hardening

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Circuit design for reliability. / Reis, Ricardo; Wirth, Gilson; Cao, Yu.

Springer New York, 2015. 272 p.

Research output: Book/ReportBook

Reis, Ricardo ; Wirth, Gilson ; Cao, Yu. / Circuit design for reliability. Springer New York, 2015. 272 p.
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