Fingerprint
Dive into the research topics of 'Characterization of structural defects in wurtzite GaN grown on 6H SiC using plasma-enhanced molecular beam epitaxy'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Characterization of structural defects in wurtzite GaN grown on 6H SiC using plasma-enhanced molecular beam epitaxy
David Smith, D. Chandrasekhar, B. Sverdlov, A. Botchkarev, A. Salvador, H. Morkoç
Research output: Contribution to journal › Article › peer-review
90
Scopus
citations