Abstract
Silicon-on-sapphire films have been characterized by high-resolution electron microscopy at 500 kV following silicon implantation and electron beam annealing. The effect of implantation with 1015 Si/cm 2 at 190 keV was to amorphize most of the 0.3-μm silicon layer, in particular breaking up the lattice defects originating from the interface. The remaining crystalline surface layer acted as a seed for the recrystallization of the film back to the interface. There was a substantial decrease in the number of lattice defects present in the silicon compared to the as-grown films, although amorphous layers varying in thickness up to 50 Å were formed at the interface. Rutherford backscattering spectrometry measurements of the film crystallinity showed good correlation with the observed microstructural changes.
Original language | English (US) |
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Pages (from-to) | 2207-2212 |
Number of pages | 6 |
Journal | Journal of Applied Physics |
Volume | 56 |
Issue number | 8 |
DOIs | |
State | Published - 1984 |
Externally published | Yes |
ASJC Scopus subject areas
- General Physics and Astronomy