Characterization of photocathode damage during high current operation of the cornellerl photoinjector

Jared Maxson, Luca Cultrera, Ivan Bazarov, Bruce Dunham, Sergey Belomestnykh, John Dobbins, Siddharth Karkare, Roger Kaplan, Vaclav Kostroun, Yulin Li, Xianghong Liu, Florian L̈ohl, Karl Smolenski, Zhi Zhao, David Rice, Peter Quigley, Maury Tigner, Vadim Veshcherevich, Kenneth Finkelstein, Darren DaleBenjamin Pichler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Cornell ERL Photoinjector prototype has recently demonstrated successful operationat 20 mA for 8 hours using a bi-alkali photocathode grown on a Si substrate. Thephotocathode film was grown off center, and remained relatively undamaged; however, uponremoval from the gun, the substrate at the gun electrostatic center displayed significantvisible damage. Here we will describe not only the parameters of that particular highcurrent run, but a suite of post-operation surface morphology and crystallographicmeasurements, including X-ray fluorescence, Xray diffraction, and contact profilometry, performed about the damage site and photocathode film. The data indicate violenttopological changes to the substrate surface, as well as significant inducedcrystallographic strain. Ion back-bombardment is proposed as a possible mechanism fordamage, and a simple model for induced crystal strain is proposed (as opposed to ioninduced sputtering), and is shown to have good qualitative agreement with the spatialdistribution of damage.

Original languageEnglish (US)
Title of host publicationIPAC 2012 - International Particle Accelerator Conference 2012
Pages2717-2719
Number of pages3
StatePublished - Dec 1 2012
Externally publishedYes
Event3rd International Particle Accelerator Conference 2012, IPAC 2012 - New Orleans, LA, United States
Duration: May 20 2012May 25 2012

Publication series

NameIPAC 2012 - International Particle Accelerator Conference 2012

Conference

Conference3rd International Particle Accelerator Conference 2012, IPAC 2012
CountryUnited States
CityNew Orleans, LA
Period5/20/125/25/12

Fingerprint

photocathodes
high current
damage
bombardment
alkalies
sputtering
prototypes
electrostatics
fluorescence
diffraction
crystals
ions
x rays

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

Cite this

Maxson, J., Cultrera, L., Bazarov, I., Dunham, B., Belomestnykh, S., Dobbins, J., ... Pichler, B. (2012). Characterization of photocathode damage during high current operation of the cornellerl photoinjector. In IPAC 2012 - International Particle Accelerator Conference 2012 (pp. 2717-2719). (IPAC 2012 - International Particle Accelerator Conference 2012).

Characterization of photocathode damage during high current operation of the cornellerl photoinjector. / Maxson, Jared; Cultrera, Luca; Bazarov, Ivan; Dunham, Bruce; Belomestnykh, Sergey; Dobbins, John; Karkare, Siddharth; Kaplan, Roger; Kostroun, Vaclav; Li, Yulin; Liu, Xianghong; L̈ohl, Florian; Smolenski, Karl; Zhao, Zhi; Rice, David; Quigley, Peter; Tigner, Maury; Veshcherevich, Vadim; Finkelstein, Kenneth; Dale, Darren; Pichler, Benjamin.

IPAC 2012 - International Particle Accelerator Conference 2012. 2012. p. 2717-2719 (IPAC 2012 - International Particle Accelerator Conference 2012).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Maxson, J, Cultrera, L, Bazarov, I, Dunham, B, Belomestnykh, S, Dobbins, J, Karkare, S, Kaplan, R, Kostroun, V, Li, Y, Liu, X, L̈ohl, F, Smolenski, K, Zhao, Z, Rice, D, Quigley, P, Tigner, M, Veshcherevich, V, Finkelstein, K, Dale, D & Pichler, B 2012, Characterization of photocathode damage during high current operation of the cornellerl photoinjector. in IPAC 2012 - International Particle Accelerator Conference 2012. IPAC 2012 - International Particle Accelerator Conference 2012, pp. 2717-2719, 3rd International Particle Accelerator Conference 2012, IPAC 2012, New Orleans, LA, United States, 5/20/12.
Maxson J, Cultrera L, Bazarov I, Dunham B, Belomestnykh S, Dobbins J et al. Characterization of photocathode damage during high current operation of the cornellerl photoinjector. In IPAC 2012 - International Particle Accelerator Conference 2012. 2012. p. 2717-2719. (IPAC 2012 - International Particle Accelerator Conference 2012).
Maxson, Jared ; Cultrera, Luca ; Bazarov, Ivan ; Dunham, Bruce ; Belomestnykh, Sergey ; Dobbins, John ; Karkare, Siddharth ; Kaplan, Roger ; Kostroun, Vaclav ; Li, Yulin ; Liu, Xianghong ; L̈ohl, Florian ; Smolenski, Karl ; Zhao, Zhi ; Rice, David ; Quigley, Peter ; Tigner, Maury ; Veshcherevich, Vadim ; Finkelstein, Kenneth ; Dale, Darren ; Pichler, Benjamin. / Characterization of photocathode damage during high current operation of the cornellerl photoinjector. IPAC 2012 - International Particle Accelerator Conference 2012. 2012. pp. 2717-2719 (IPAC 2012 - International Particle Accelerator Conference 2012).
@inproceedings{f2cbec23442e487384a345cbfb626ac8,
title = "Characterization of photocathode damage during high current operation of the cornellerl photoinjector",
abstract = "The Cornell ERL Photoinjector prototype has recently demonstrated successful operationat 20 mA for 8 hours using a bi-alkali photocathode grown on a Si substrate. Thephotocathode film was grown off center, and remained relatively undamaged; however, uponremoval from the gun, the substrate at the gun electrostatic center displayed significantvisible damage. Here we will describe not only the parameters of that particular highcurrent run, but a suite of post-operation surface morphology and crystallographicmeasurements, including X-ray fluorescence, Xray diffraction, and contact profilometry, performed about the damage site and photocathode film. The data indicate violenttopological changes to the substrate surface, as well as significant inducedcrystallographic strain. Ion back-bombardment is proposed as a possible mechanism fordamage, and a simple model for induced crystal strain is proposed (as opposed to ioninduced sputtering), and is shown to have good qualitative agreement with the spatialdistribution of damage.",
author = "Jared Maxson and Luca Cultrera and Ivan Bazarov and Bruce Dunham and Sergey Belomestnykh and John Dobbins and Siddharth Karkare and Roger Kaplan and Vaclav Kostroun and Yulin Li and Xianghong Liu and Florian L̈ohl and Karl Smolenski and Zhi Zhao and David Rice and Peter Quigley and Maury Tigner and Vadim Veshcherevich and Kenneth Finkelstein and Darren Dale and Benjamin Pichler",
year = "2012",
month = "12",
day = "1",
language = "English (US)",
isbn = "9783954501151",
series = "IPAC 2012 - International Particle Accelerator Conference 2012",
pages = "2717--2719",
booktitle = "IPAC 2012 - International Particle Accelerator Conference 2012",

}

TY - GEN

T1 - Characterization of photocathode damage during high current operation of the cornellerl photoinjector

AU - Maxson, Jared

AU - Cultrera, Luca

AU - Bazarov, Ivan

AU - Dunham, Bruce

AU - Belomestnykh, Sergey

AU - Dobbins, John

AU - Karkare, Siddharth

AU - Kaplan, Roger

AU - Kostroun, Vaclav

AU - Li, Yulin

AU - Liu, Xianghong

AU - L̈ohl, Florian

AU - Smolenski, Karl

AU - Zhao, Zhi

AU - Rice, David

AU - Quigley, Peter

AU - Tigner, Maury

AU - Veshcherevich, Vadim

AU - Finkelstein, Kenneth

AU - Dale, Darren

AU - Pichler, Benjamin

PY - 2012/12/1

Y1 - 2012/12/1

N2 - The Cornell ERL Photoinjector prototype has recently demonstrated successful operationat 20 mA for 8 hours using a bi-alkali photocathode grown on a Si substrate. Thephotocathode film was grown off center, and remained relatively undamaged; however, uponremoval from the gun, the substrate at the gun electrostatic center displayed significantvisible damage. Here we will describe not only the parameters of that particular highcurrent run, but a suite of post-operation surface morphology and crystallographicmeasurements, including X-ray fluorescence, Xray diffraction, and contact profilometry, performed about the damage site and photocathode film. The data indicate violenttopological changes to the substrate surface, as well as significant inducedcrystallographic strain. Ion back-bombardment is proposed as a possible mechanism fordamage, and a simple model for induced crystal strain is proposed (as opposed to ioninduced sputtering), and is shown to have good qualitative agreement with the spatialdistribution of damage.

AB - The Cornell ERL Photoinjector prototype has recently demonstrated successful operationat 20 mA for 8 hours using a bi-alkali photocathode grown on a Si substrate. Thephotocathode film was grown off center, and remained relatively undamaged; however, uponremoval from the gun, the substrate at the gun electrostatic center displayed significantvisible damage. Here we will describe not only the parameters of that particular highcurrent run, but a suite of post-operation surface morphology and crystallographicmeasurements, including X-ray fluorescence, Xray diffraction, and contact profilometry, performed about the damage site and photocathode film. The data indicate violenttopological changes to the substrate surface, as well as significant inducedcrystallographic strain. Ion back-bombardment is proposed as a possible mechanism fordamage, and a simple model for induced crystal strain is proposed (as opposed to ioninduced sputtering), and is shown to have good qualitative agreement with the spatialdistribution of damage.

UR - http://www.scopus.com/inward/record.url?scp=84885639984&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84885639984&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84885639984

SN - 9783954501151

T3 - IPAC 2012 - International Particle Accelerator Conference 2012

SP - 2717

EP - 2719

BT - IPAC 2012 - International Particle Accelerator Conference 2012

ER -