TY - JOUR
T1 - Characterization of near- and far-field radiation from ultrafast electronic systems
AU - Remley, Kate A.
AU - Weisshaar, Andreas
AU - Goodnick, Stephen M.
AU - Tripathi, Vijai K.
N1 - Funding Information:
Manuscript received March 27, 1998; revised September 3, 1998. This work was supported by National Science Foundation under Grant ECS-9312240. The work of K. A. Remley was supported in part by a National Science Foundation Graduate Research Fellowship.
PY - 1998
Y1 - 1998
N2 - Accurate and computationally efficient characterization of near- and far-field radiation from a class of microwave, millimeter wave, and ultrafast systems is presented. A numerical technique is utilized which combines the finite-difference timedomain method with a spatial transformation, the Kirchhoff surface integral. Included in the analysis are inhomogeneous material parameters, small feature size relative to wavelengths of interest, and the wide-band nature of the radiation. Based on simulation results, a simple model of the radiation from an inhomogeneous structure is developed. Finally, the technique is applied to accurately characterize the radiation from a photoconducting structure. Index Terms- Electromagnetic radiation modeling, FDTD methods, photoconducting devices, ultrafast electronics.
AB - Accurate and computationally efficient characterization of near- and far-field radiation from a class of microwave, millimeter wave, and ultrafast systems is presented. A numerical technique is utilized which combines the finite-difference timedomain method with a spatial transformation, the Kirchhoff surface integral. Included in the analysis are inhomogeneous material parameters, small feature size relative to wavelengths of interest, and the wide-band nature of the radiation. Based on simulation results, a simple model of the radiation from an inhomogeneous structure is developed. Finally, the technique is applied to accurately characterize the radiation from a photoconducting structure. Index Terms- Electromagnetic radiation modeling, FDTD methods, photoconducting devices, ultrafast electronics.
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U2 - 10.1109/22.739237
DO - 10.1109/22.739237
M3 - Article
AN - SCOPUS:0032292172
SN - 0018-9480
VL - 46
SP - 2476
EP - 2483
JO - IEEE Transactions on Microwave Theory and Techniques
JF - IEEE Transactions on Microwave Theory and Techniques
IS - 12 PART 2
ER -