Characterization of near- and far-field radiation from ultrafast electronic systems

Kate A. Remley, Andreas Weisshaar, Stephen M. Goodnick, Vijai K. Tripathi

Research output: Contribution to journalArticle

8 Scopus citations

Abstract

Accurate and computationally efficient characterization of near- and far-field radiation from a class of microwave, millimeter wave, and ultrafast systems is presented. A numerical technique is utilized which combines the finite-difference timedomain method with a spatial transformation, the Kirchhoff surface integral. Included in the analysis are inhomogeneous material parameters, small feature size relative to wavelengths of interest, and the wide-band nature of the radiation. Based on simulation results, a simple model of the radiation from an inhomogeneous structure is developed. Finally, the technique is applied to accurately characterize the radiation from a photoconducting structure. Index Terms- Electromagnetic radiation modeling, FDTD methods, photoconducting devices, ultrafast electronics.

Original languageEnglish (US)
Pages (from-to)2476-2483
Number of pages8
JournalIEEE Transactions on Microwave Theory and Techniques
Volume46
Issue number12 PART 2
DOIs
StatePublished - Dec 1 1998
Externally publishedYes

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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