Original languageEnglish (US)
Pages (from-to)258-259
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014

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Electron holography
holography
Heterojunctions
electrons

ASJC Scopus subject areas

  • Instrumentation

Cite this

Characterization of N-polar GaN/AlGaN/GaN heterostructures using electron holography. / Boley, A.; Storm, D. F.; McCartney, Martha; Smith, David.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 258-259.

Research output: Contribution to journalArticle

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