Abstract
The delay-change curve (DCC) characterizes the variation the interconnect delay due to coupling noise. This paper describes a set of novel models that relate the DCC to the coupling noise waveform. These models are targeted for use in the timing margin design and accurate experimental determination of sub-nanosecond coupling noise. The circuit structure, a set of measurements, the model equations, and the waveform extraction procedures are newly proposed. Evaluation results using a 0.25-μm test chip are presented showing good agreement with SPICE simulations.
Original language | English (US) |
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Title of host publication | Proceedings of the Annual IEEE International ASIC Conference and Exhibit |
Publisher | IEEE |
Pages | 321-325 |
Number of pages | 5 |
State | Published - 2000 |
Externally published | Yes |
Event | Proceedings of the 13th Annual IEEE International ASIC/SOC Conference - Arlington, VA, USA Duration: Sep 13 2000 → Sep 16 2000 |
Other
Other | Proceedings of the 13th Annual IEEE International ASIC/SOC Conference |
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City | Arlington, VA, USA |
Period | 9/13/00 → 9/16/00 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering