Engineering & Materials Science
Photoluminescence
100%
Epitaxial films
93%
X ray diffraction
40%
Carrier lifetime
32%
Metallorganic chemical vapor deposition
32%
Point defects
31%
Linewidth
25%
Transmission electron microscopy
21%
Impurities
19%
Masks
19%
Temperature
16%
Defects
14%
Cracks
13%
Chemical Compounds
Epitaxial Film
87%
Threading Dislocation
77%
Photoluminescence
47%
Porosity
35%
Crystal Point Defect
26%
X-Ray Diffraction
20%
Reduction
18%
Chemical Vapour Deposition
18%
Transmission Electron Microscopy
13%
Ambient Reaction Temperature
11%
Time
7%
Mathematics
Template
74%
Photoluminescence
43%
Characterization
32%
Dislocation
28%
X-ray Diffraction
24%
Lateral
17%
Lifetime
15%
Chemical Vapor Deposition
14%
Transmission Electron Microscopy
13%
Linewidth
13%
Point Defects
12%
Impurities
10%
Mask
9%
Network Structure
9%
Defects
7%
Crack
7%
Decrease
6%
Decay
6%
Inclusion
6%
Observation
5%
Physics & Astronomy
templates
57%
characterization
34%
photoluminescence
16%
diffraction
8%
carrier lifetime
8%
metalorganic chemical vapor deposition
7%
point defects
7%
x rays
6%
masks
6%
inclusions
6%
cracks
5%
life (durability)
5%
impurities
5%
transmission electron microscopy
5%
decay
4%
room temperature
4%
defects
4%