Characterization of Encapsulant Degradation in Accelerated UV Stressed Mini-Modules with UV-cut and UV-pass EVA

Hamsini Gopalakrishna, Pooja Arularasu, Kshitiz Dolia, Archana Sinha, Govindasamy Tamizhmani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Encapsulant browning and delamination are two common degradation modes in the crystalline silicon field exposed modules with ethyl vinyl acetate (EVA) as the encapsulant. Six mini-modules with two types of encapsulants: UV-cut (UVC) EVA and UV-pass (UVP) EVA, were exposed to an accelerated UV testing with total UV dosage of 800 kWh/m2 (between 300 nm - 400 nm) at different temperatures. The UVC mini-modules were maintained at 61°C, 66°C, and 73°C and the UVP mini-modules were maintained at 61°C, 67°C, and 70°C. UV fluorescence (UVF) imaging, cell-level Isc measurements, yellowness index measurements and reflectance measurements were performed intermittently to evaluate the cell performance. UVF images show an increased extent and intensity of browning in UVC mini-modules. The UVP mini-modules show delamination but no browning. The average Isc drop for three UVC and three UVP mini-modules were 2.0%, 3.7%, and 4.2%, and 3.1%, 4.4%, and 4.9%, respectively. Correspondingly, a yellowness index increase of 9.5, 12.4, and 17.2 for UVC and 0.28, 1.02, and 0.32 for UVP mini-modules was measured. The reflectance of UVC mini-modules showed an increase in the 500 nm - 700 nm wavelength range. The characterization results indicate that the EVA browning and delamination are the main degradation modes in UVC and UVP mini-modules, respectively.

Original languageEnglish (US)
Title of host publication2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1961-1964
Number of pages4
ISBN (Electronic)9781728104942
DOIs
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: Jun 16 2019Jun 21 2019

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
CountryUnited States
CityChicago
Period6/16/196/21/19

Keywords

  • delamination
  • Encapsulant browning
  • UV cut
  • UV pass
  • yellowness index

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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    Gopalakrishna, H., Arularasu, P., Dolia, K., Sinha, A., & Tamizhmani, G. (2019). Characterization of Encapsulant Degradation in Accelerated UV Stressed Mini-Modules with UV-cut and UV-pass EVA. In 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019 (pp. 1961-1964). [8980897] (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC40753.2019.8980897