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Dive into the research topics of 'CHARACTERIZATION OF ELECTRON TRAPS RESULTING FROM OXYGEN PRECIPITATION IN Cz SILICON.'. Together they form a unique fingerprint.- Sort by
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J. Whitfield, C. J. Varker, S. S. Chan, Ray Carpenter, Stephen Krause, S. J. Krause, E. R. Weber
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution