Characterization of electrical properties in axial Si-Ge nanowire heterojunctions using off-axis electron holography and atom-probe tomography

Zhaofeng Gan, Daniel E. Perea, Jinkyoung Yoo, Yang He, Robert J. Colby, Josh E. Barker, Meng Gu, Scott X. Mao, Chongmin Wang, S. T. Picraux, David Smith, Martha McCartney

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Physics & Astronomy