CHARACTERIZATION OF DISLOCATIONS AND INTERFACES IN SEMICONDUCTORS BY HIGH RESOLUTION ELECTRON MICROSCOPY.

J. C.H. Spence, A. Olsen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fingerprint

Dive into the research topics of 'CHARACTERIZATION OF DISLOCATIONS AND INTERFACES IN SEMICONDUCTORS BY HIGH RESOLUTION ELECTRON MICROSCOPY.'. Together they form a unique fingerprint.