Characterization and quantitative analysis of ultra-thin GaAs single-junction solar cells with reflective back scattering

Shi Liu, Weiquan Yang, Jacob Becker, Ying Shen Kuo, Yong-Hang Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This paper studies the impacts of the non-ideal reflective back scattering, non-radiative recombination, and series resistance on the device performance of ultra-thin GaAs single-junction solar cells. The reflectivity of the textured AlInP/Au interface is calculated by averaging the angular reflectivity against the Lambertian distribution, the value of which is 95% at the GaAs absorption edge. The impact of non-ideal scattering on short-circuit current density (Jsc) and external quantum efficiency (EQE) is investigated using Phong's distribution and a Phong exponent m of ∼12 is determined by fitting both simulated Jsc and EQE to their experimental values. The measured open-circuit voltage (Voc) is lower than the best achievable value, and the difference is attributed to the non-radiative recombination in the device. Fitting of the measured Voc gives a lifetime of ∼130 ns. The impact of series resistance on fill factor is also studied using the single diode equivalent circuit model and the specific series resistivity of the device is determined to be ∼1.2 ω·cm2.

Original languageEnglish (US)
Title of host publication2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages487-490
Number of pages4
ISBN (Electronic)9781479943982
DOIs
StatePublished - Oct 15 2014
Event40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States
Duration: Jun 8 2014Jun 13 2014

Publication series

Name2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Other

Other40th IEEE Photovoltaic Specialist Conference, PVSC 2014
CountryUnited States
CityDenver
Period6/8/146/13/14

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Keywords

  • gallium arsenide
  • photovoltaic cell
  • surface texture
  • thin film devices

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Liu, S., Yang, W., Becker, J., Kuo, Y. S., & Zhang, Y-H. (2014). Characterization and quantitative analysis of ultra-thin GaAs single-junction solar cells with reflective back scattering. In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 (pp. 487-490). [6924965] (2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2014.6924965